Behavioural modelling for stability of CMOS SRAM cells subject to random discrete doping


Wang, Yangang, Zwolinski, Mark and Merrett, Michael (2008) Behavioural modelling for stability of CMOS SRAM cells subject to random discrete doping At IEEE Inernational Behavioral Modeling and Simulation Workshop (BMAS), United States.

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Item Type: Conference or Workshop Item (Paper)
Venue - Dates: IEEE Inernational Behavioral Modeling and Simulation Workshop (BMAS), United States, 2008-09-01
Organisations: EEE
ePrint ID: 267236
Date :
Date Event
September 2008Published
Date Deposited: 31 Mar 2009 16:41
Last Modified: 17 Apr 2017 18:51
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/267236

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