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Behavioural modelling for stability of CMOS SRAM cells subject to random discrete doping

Wang, Yangang, Zwolinski, Mark and Merrett, Michael (2008) Behavioural modelling for stability of CMOS SRAM cells subject to random discrete doping At IEEE Inernational Behavioral Modeling and Simulation Workshop (BMAS), United States.

Record type: Conference or Workshop Item (Paper)

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Published date: September 2008
Venue - Dates: IEEE Inernational Behavioral Modeling and Simulation Workshop (BMAS), United States, 2008-09-01
Organisations: EEE

Identifiers

Local EPrints ID: 267236
URI: http://eprints.soton.ac.uk/id/eprint/267236
PURE UUID: b5851188-7fb0-46c8-9e72-0b5733e08328
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 31 Mar 2009 16:41
Last modified: 18 Jul 2017 07:06

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Contributors

Author: Yangang Wang
Author: Mark Zwolinski ORCID iD
Author: Michael Merrett

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