Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy


Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2004) Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy Microelectronic Engineering, 73-74, pp. 615-619.

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Item Type: Article
ISSNs: 0167-9317 (print)
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 267422
Date :
Date Event
18 March 2004Published
Date Deposited: 29 May 2009 16:11
Last Modified: 17 Apr 2017 18:48
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/267422

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