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Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy

Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy
Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy
0167-9317
615-619
Kanjanachuchai, S
6d27a3a2-57b5-43f0-bfdb-2e1463cff944
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K
9c9e150c-6d0f-4710-a534-2bfda5d012fa
Oda, S
514339b3-f8de-4750-8d20-c520834b2477
Kanjanachuchai, S
6d27a3a2-57b5-43f0-bfdb-2e1463cff944
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K
9c9e150c-6d0f-4710-a534-2bfda5d012fa
Oda, S
514339b3-f8de-4750-8d20-c520834b2477

Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2004) Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy. Microelectronic Engineering, 73-74, 615-619.

Record type: Article
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More information

Published date: 18 March 2004
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 267422
URI: http://eprints.soton.ac.uk/id/eprint/267422
ISSN: 0167-9317
PURE UUID: 5535d3a3-9614-4b4a-a6f3-76b6eaba86af

Catalogue record

Date deposited: 29 May 2009 16:11
Last modified: 20 Nov 2021 09:12

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Contributors

Author: S Kanjanachuchai
Author: Yoshishige Tsuchiya
Author: K Usami
Author: S Oda

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