The University of Southampton
University of Southampton Institutional Repository

Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy

Record type: Article
PDF ePaper005.pdf - Other
Download (350kB)

Citation

Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2004) Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy Microelectronic Engineering, 73-74, pp. 615-619.

More information

Published date: 18 March 2004
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 267422
URI: http://eprints.soton.ac.uk/id/eprint/267422
ISSN: 0167-9317
PURE UUID: 5535d3a3-9614-4b4a-a6f3-76b6eaba86af

Catalogue record

Date deposited: 29 May 2009 16:11
Last modified: 18 Jul 2017 07:04

Export record

Contributors

Author: S Kanjanachuchai
Author: Yoshishige Tsuchiya
Author: K Usami
Author: S Oda

University divisions


Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×