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Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy

Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy
Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy
Kanjanachuchai, S
6d27a3a2-57b5-43f0-bfdb-2e1463cff944
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K
9c9e150c-6d0f-4710-a534-2bfda5d012fa
Oda, S
514339b3-f8de-4750-8d20-c520834b2477
Kanjanachuchai, S
6d27a3a2-57b5-43f0-bfdb-2e1463cff944
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Usami, K
9c9e150c-6d0f-4710-a534-2bfda5d012fa
Oda, S
514339b3-f8de-4750-8d20-c520834b2477

Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2003) Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy. Micro and Nano Engineering 2003, United Kingdom. 22 - 25 Sep 2003.

Record type: Conference or Workshop Item (Other)

Full text not available from this repository.

More information

Published date: September 2003
Additional Information: Event Dates: 22-25 September
Venue - Dates: Micro and Nano Engineering 2003, United Kingdom, 2003-09-22 - 2003-09-25
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 267443
URI: http://eprints.soton.ac.uk/id/eprint/267443
PURE UUID: e66cb170-21b9-4ed5-82c8-1709857b58a0

Catalogue record

Date deposited: 01 Jun 2009 15:10
Last modified: 18 Jul 2017 07:04

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