Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2003) Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy. Micro and Nano Engineering 2003, Cambridge, United Kingdom. 21 - 24 Sep 2003.
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Published date: September 2003
Additional Information:
Event Dates: 22-25 September
Venue - Dates:
Micro and Nano Engineering 2003, Cambridge, United Kingdom, 2003-09-21 - 2003-09-24
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 267443
URI: http://eprints.soton.ac.uk/id/eprint/267443
PURE UUID: e66cb170-21b9-4ed5-82c8-1709857b58a0
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Date deposited: 01 Jun 2009 15:10
Last modified: 10 Dec 2021 22:31
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Contributors
Author:
S Kanjanachuchai
Author:
Yoshishige Tsuchiya
Author:
K Usami
Author:
S Oda
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