Efficient test compaction for combinational circuits based on Fault detection count-directed clustering
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering
Test compaction is an effective technique for reducing test data volume and test application time. The authors present a new static test compaction technique based on test vector decomposition and clustering. Test vectors are decomposed and clustered for faults in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Experimental results demonstrate the effectiveness of the proposed approach in achieving higher compaction in a much more efficient CPU time than the previous clustering-based test compaction approaches.
El-Maleh, Aiman
5f9ddeed-c012-473e-9b67-ac218e8bec40
Khursheed, Syed Saqib
df76c622-61ca-45b2-b067-2753f1ac0abf
July 2007
El-Maleh, Aiman
5f9ddeed-c012-473e-9b67-ac218e8bec40
Khursheed, Syed Saqib
df76c622-61ca-45b2-b067-2753f1ac0abf
El-Maleh, Aiman and Khursheed, Syed Saqib
(2007)
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering.
IET Computers & Digital Techniques, 1 (4).
Abstract
Test compaction is an effective technique for reducing test data volume and test application time. The authors present a new static test compaction technique based on test vector decomposition and clustering. Test vectors are decomposed and clustered for faults in an increasing order of faults detection count. This clustering order gives more degree of freedom and results in better compaction. Experimental results demonstrate the effectiveness of the proposed approach in achieving higher compaction in a much more efficient CPU time than the previous clustering-based test compaction approaches.
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Khursheed-IET07.pdf
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Published date: July 2007
Organisations:
Electronic & Software Systems
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Local EPrints ID: 267549
URI: http://eprints.soton.ac.uk/id/eprint/267549
PURE UUID: 745d9358-0fc3-46c2-8edb-7d60b697abb0
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Date deposited: 11 Jun 2009 12:25
Last modified: 14 Mar 2024 08:52
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Author:
Aiman El-Maleh
Author:
Syed Saqib Khursheed
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