Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation
In this paper we present efficient Reverse Order Restoration (ROR) based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation based restoration of test subsequences, our technique restores test sequences based on efficient test relaxation. The restored test subsequence can be either concatenated to the compacted test sequence, as in previous approaches, or merged with it. Furthermore, it allows the removal of redundant vectors from the restored subsequences using State Traversal technique and incorporates schemes for increasing the fault coverage of restored test subsequences to achieve an overall higher level of compaction. In addition, test relaxation is used to take ROR out of saturation. Experimental results demonstrate the effectiveness of the proposed techniques.
El-Maleh, Aiman
5f9ddeed-c012-473e-9b67-ac218e8bec40
Khursheed, Syed Saqib
df76c622-61ca-45b2-b067-2753f1ac0abf
M. Sait, Sadiq
1c02f129-ac17-43c7-ae8b-5d04d445a897
December 2005
El-Maleh, Aiman
5f9ddeed-c012-473e-9b67-ac218e8bec40
Khursheed, Syed Saqib
df76c622-61ca-45b2-b067-2753f1ac0abf
M. Sait, Sadiq
1c02f129-ac17-43c7-ae8b-5d04d445a897
El-Maleh, Aiman, Khursheed, Syed Saqib and M. Sait, Sadiq
(2005)
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation.
Asian Test Symposium.
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Conference or Workshop Item
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Abstract
In this paper we present efficient Reverse Order Restoration (ROR) based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation based restoration of test subsequences, our technique restores test sequences based on efficient test relaxation. The restored test subsequence can be either concatenated to the compacted test sequence, as in previous approaches, or merged with it. Furthermore, it allows the removal of redundant vectors from the restored subsequences using State Traversal technique and incorporates schemes for increasing the fault coverage of restored test subsequences to achieve an overall higher level of compaction. In addition, test relaxation is used to take ROR out of saturation. Experimental results demonstrate the effectiveness of the proposed techniques.
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Khursheed-ATS05.pdf
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Published date: December 2005
Venue - Dates:
Asian Test Symposium, 2005-12-01
Organisations:
Electronic & Software Systems
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Local EPrints ID: 267550
URI: http://eprints.soton.ac.uk/id/eprint/267550
PURE UUID: 72096010-60aa-4913-ae16-0e8f4847d2fa
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Date deposited: 11 Jun 2009 12:30
Last modified: 14 Mar 2024 08:52
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Contributors
Author:
Aiman El-Maleh
Author:
Syed Saqib Khursheed
Author:
Sadiq M. Sait
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