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Modelling of Partial Discharge Activity in Different Spherical Cavity Sizes and Locations within a Dielectric Insulation Material

Modelling of Partial Discharge Activity in Different Spherical Cavity Sizes and Locations within a Dielectric Insulation Material
Modelling of Partial Discharge Activity in Different Spherical Cavity Sizes and Locations within a Dielectric Insulation Material
The pattern of partial discharge (PD) occurrence at a defect site within a solid dielectric material is influenced by the conditions of the defect site. This is because the defect conditions, mainly its size and location determine the electric field distributions at the defect site which influence the patterns of PD occurrence. A model for a spherical cavity within a homogeneous dielectric material has been developed by using Finite Element Analysis (FEA) software. The model is used to study the influence of different conditions of the cavity on the electric field distribution in the cavity and the PD activity. In addition, experimental measurements of PD in spherical cavities of different size within a dielectric material have been undertaken. The obtained results show that PD activity depends on the size of the cavity within the dielectric material.
485-488
Illias, H A
882c48a3-4f17-474b-954f-dfb8584db498
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Illias, H A
882c48a3-4f17-474b-954f-dfb8584db498
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e

Illias, H A, Chen, G and Lewin, P L (2009) Modelling of Partial Discharge Activity in Different Spherical Cavity Sizes and Locations within a Dielectric Insulation Material. The 9th International Conference on Properties and Applications of Dielectric Materials, China. 19 - 23 Jul 2009. pp. 485-488 .

Record type: Conference or Workshop Item (Paper)

Abstract

The pattern of partial discharge (PD) occurrence at a defect site within a solid dielectric material is influenced by the conditions of the defect site. This is because the defect conditions, mainly its size and location determine the electric field distributions at the defect site which influence the patterns of PD occurrence. A model for a spherical cavity within a homogeneous dielectric material has been developed by using Finite Element Analysis (FEA) software. The model is used to study the influence of different conditions of the cavity on the electric field distribution in the cavity and the PD activity. In addition, experimental measurements of PD in spherical cavities of different size within a dielectric material have been undertaken. The obtained results show that PD activity depends on the size of the cavity within the dielectric material.

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More information

Published date: 19 July 2009
Additional Information: Event Dates: 19 - 23 July 2009
Venue - Dates: The 9th International Conference on Properties and Applications of Dielectric Materials, China, 2009-07-19 - 2009-07-23
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 267722
URI: https://eprints.soton.ac.uk/id/eprint/267722
PURE UUID: d0332117-0e75-452e-aa03-922b9105450f

Catalogue record

Date deposited: 29 Jul 2009 11:51
Last modified: 28 Oct 2019 21:21

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Contributors

Author: H A Illias
Author: G Chen
Author: P L Lewin

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