The University of Southampton
University of Southampton Institutional Repository

Raman microprobe analysis and ageing in dielectrics

Raman microprobe analysis and ageing in dielectrics
Raman microprobe analysis and ageing in dielectrics
Subsurface voids in samples of electrically stressed low density polyethylene (LDPE) were analysed using confocal Raman microprobe spectroscopy (CRMS). An optical depth profiling technique was used to probe a void along the optic axis whilst a burst void was analysed at various lateral positions. Spectra from the voided samples showed signatures with similar features to those found in previous studies of electrical trees in polyethylene, including the presence of the D and G bands of disordered sp2 carbon. Results and spectra were then compared to the depth profiles and spectra from block and thin film samples of polyethylene and polystyrene which indicated that the established theory behind CRMS is oversimplified and that the detected signal is largely influenced by the optical properties of the material in question. Overall the study showed that despite some spatial resolution limitations of the technique, depth profiling is a useful tool in the analysis of aged polymers and dielectrics as it can show the variations in chemical composition with respect to position along the lateral and optic axis, a property especially relevant to electrical trees.
1742-6588
012016-1-012016-5
Freebody, N A
fdec3bc9-0399-43bb-83a3-b099dd431c3f
Vaughan, A S
6d813b66-17f9-4864-9763-25a6d659d8a3
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Freebody, N A
fdec3bc9-0399-43bb-83a3-b099dd431c3f
Vaughan, A S
6d813b66-17f9-4864-9763-25a6d659d8a3
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e

Freebody, N A, Vaughan, A S and Lewin, P L (2009) Raman microprobe analysis and ageing in dielectrics. Journal of Physics: Conference Series, 183, 012016-1-012016-5.

Record type: Article

Abstract

Subsurface voids in samples of electrically stressed low density polyethylene (LDPE) were analysed using confocal Raman microprobe spectroscopy (CRMS). An optical depth profiling technique was used to probe a void along the optic axis whilst a burst void was analysed at various lateral positions. Spectra from the voided samples showed signatures with similar features to those found in previous studies of electrical trees in polyethylene, including the presence of the D and G bands of disordered sp2 carbon. Results and spectra were then compared to the depth profiles and spectra from block and thin film samples of polyethylene and polystyrene which indicated that the established theory behind CRMS is oversimplified and that the detected signal is largely influenced by the optical properties of the material in question. Overall the study showed that despite some spatial resolution limitations of the technique, depth profiling is a useful tool in the analysis of aged polymers and dielectrics as it can show the variations in chemical composition with respect to position along the lateral and optic axis, a property especially relevant to electrical trees.

Text
jpconf9_183_012016.pdf - Version of Record
Restricted to Registered users only
Download (824kB)
Request a copy

More information

Published date: 10 September 2009
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 267850
URI: https://eprints.soton.ac.uk/id/eprint/267850
ISSN: 1742-6588
PURE UUID: 836da4e0-bd17-4e74-ab2e-8012fa9a6311
ORCID for A S Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 10 Sep 2009 17:06
Last modified: 20 Jul 2019 01:07

Export record

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of https://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×