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Yield improvement using configurable analogue transistors

Wilson, PR and Wilcock, R (2008) Yield improvement using configurable analogue transistors Electronics Letters, 44, pp. 1132-1133.

Record type: Article


Continued process scaling has led to significant yield and reliability challenges for today's designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. A new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage is described. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit.

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Published date: 2008
Additional Information: Imported from ISI Web of Science
Organisations: Electronics & Computer Science


Local EPrints ID: 269506
ISSN: 0013-5194
PURE UUID: b0aa6041-e43b-4197-8ecc-57ea6e033150

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Date deposited: 21 Apr 2010 07:46
Last modified: 11 Jul 2017 09:50

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Author: PR Wilson
Author: R Wilcock

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