Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides


Chen, Ruiqi, Charlton, Martin and Lagoudakis, Pavlos (2009) Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides Proceedings of SPIE - The International Society for Optical Engineering, 7420

Download

[img] PDF SPIE_manuscript_for_approval_v2.pdf - Other
Download (2MB)

Description/Abstract

We utilize analysis of third harmonic generation under femtosecond pulsed excitation as a reference free measurement method for third order nonlinear susceptibility (? (3) or “Chi 3”) of planar waveguides. We investigate ? (3) dispersion in planar Ta2O5 waveguides at wavelengths either side of the telecoms window, obtaining a nonlinear coefficient of 2 ×10?13 esu, at 1550 nm. Our study indicates that ? (3) increases within the measured wavelength range due to a threephoton resonance of Ta2O5 electrons, revealing the potential of this material system in high speed integrated nonlinear optical switches for the telecommunications spectral window.

Item Type: Article
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 270977
Date :
Date Event
2 August 2009Published
Date Deposited: 04 May 2010 11:01
Last Modified: 17 Apr 2017 18:26
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/270977

Actions (login required)

View Item View Item