The effect of thermal ageing on the rheological, thermal and electrical properties of poly(ethylene oxide)
The effect of thermal ageing on the rheological, thermal and electrical properties of poly(ethylene oxide)
Polyethylene oxide (PEO) is a water-soluble polymer often used as a model system to observe filler effects. This paper details an investigation into the physical, thermal and electrical properties of thermally aged PEO. Three molecular weight host PEOs were tested for thermal ageing resistance - 100,000 g mol-1, 400,000 g mol-1 and 1,000,000 g mol-1. Thermally aged 100,000 g mol-1 molecular weight PEO samples were then tested using techniques such as- rheometry, differential scanning calorimetry (DSC) and AC electrical breakdown.
85-88
Reading, M
00efdd81-2dd9-4ac6-a7cd-f54b912aad46
Vaughan, A S
6d813b66-17f9-4864-9763-25a6d659d8a3
17 October 2010
Reading, M
00efdd81-2dd9-4ac6-a7cd-f54b912aad46
Vaughan, A S
6d813b66-17f9-4864-9763-25a6d659d8a3
Reading, M and Vaughan, A S
(2010)
The effect of thermal ageing on the rheological, thermal and electrical properties of poly(ethylene oxide).
2010 Conference on Electrical Insulation and Dielectric Phenomena, Purdue University, West Lafayette, Indiana, United States.
17 - 20 Oct 2010.
.
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Conference or Workshop Item
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Abstract
Polyethylene oxide (PEO) is a water-soluble polymer often used as a model system to observe filler effects. This paper details an investigation into the physical, thermal and electrical properties of thermally aged PEO. Three molecular weight host PEOs were tested for thermal ageing resistance - 100,000 g mol-1, 400,000 g mol-1 and 1,000,000 g mol-1. Thermally aged 100,000 g mol-1 molecular weight PEO samples were then tested using techniques such as- rheometry, differential scanning calorimetry (DSC) and AC electrical breakdown.
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Published date: 17 October 2010
Additional Information:
Event Dates: 17 - 20 October 2010
Venue - Dates:
2010 Conference on Electrical Insulation and Dielectric Phenomena, Purdue University, West Lafayette, Indiana, United States, 2010-10-17 - 2010-10-20
Organisations:
Electronics & Computer Science, EEE
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Local EPrints ID: 271637
URI: http://eprints.soton.ac.uk/id/eprint/271637
PURE UUID: c076c861-35c7-4451-a4de-460e8e682e3a
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Date deposited: 18 Oct 2010 20:38
Last modified: 15 Mar 2024 03:05
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Author:
M Reading
Author:
A S Vaughan
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