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On the use of Raman and FTIR Spectroscopy for the Analysis of Silica-based Nanofillers

Yeung, C, Gherbaz, G and Vaughan, A S (2010) On the use of Raman and FTIR Spectroscopy for the Analysis of Silica-based Nanofillers At 2010 Conference on Electrical Insulation and Dielectric Phenomena, United States. 17 - 20 Oct 2010. , pp. 526-529.

Record type: Conference or Workshop Item (Paper)

Abstract

This paper details our research into the interfacial regions of nanocomposites, using vibrational spectroscopy to characterize the surface chemistry of differently modified particulate fillers. Results obtained from both nano- and micro-silica are reported as a function of silane treatment. Materials with varying surface concentrations of epoxide groups were produced by altering the chemical processing conditions. Raman spectroscopy is capable of providing qualitative data concerning the functionalization level, but the technique is incapable of providing absolute concentrations. Although FTIR should be capable of providing more quantitative data, anomalously high apparent concentrations are obtained, suggesting that the interactions occurring within dispersed particulate systems are rather more complex than implied by classical Beer Lambert behavior.

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More information

Published date: 17 October 2010
Additional Information: Event Dates: 17 - 20 October 2010
Venue - Dates: 2010 Conference on Electrical Insulation and Dielectric Phenomena, United States, 2010-10-17 - 2010-10-20
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 271646
URI: http://eprints.soton.ac.uk/id/eprint/271646
PURE UUID: 842f54a9-aec9-4c90-9136-633bd2e6e80c

Catalogue record

Date deposited: 20 Oct 2010 13:43
Last modified: 18 Jul 2017 06:40

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Contributors

Author: C Yeung
Author: G Gherbaz
Author: A S Vaughan

University divisions

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