The Propagation Losses of Cold Deposited Zinc Sulfide Waveguides
The Propagation Losses of Cold Deposited Zinc Sulfide Waveguides
Zinc sulfide (ZnS) waveguides with the thickness of 0.5 µm have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50°C) and ambient temperature (Tambient = 25°C) by thermal evaporation technique. The propagation losses of ZnS waveguides were determined by a scattering detection method. The propagation losses of cold deposited ZnS waveguide were 20.41, 11.35, 3.51 and 2.30 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. Where as, the propagation losses of ambient deposited ZnS waveguide were 131.50, 47.99, 4.43 and 2.74 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. The propagation loss of the cold deposited ZnS waveguide was dominated by surface scattering whereas the propagation loss of the ambient deposited ZnS waveguide was dominated by bulk scattering.
cold deposition, waveguide, zinc sulfide, propagation loss
Salleh, S.
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Dalimin, M.N.
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Rutt, H.N.
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Salleh, S.
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Dalimin, M.N.
bf509261-2a08-44b7-b828-4dbdf846b60a
Rutt, H.N.
e09fa327-0c01-467a-9898-4e7f0cd715fc
Salleh, S., Dalimin, M.N. and Rutt, H.N.
(2011)
The Propagation Losses of Cold Deposited Zinc Sulfide Waveguides.
OEMA2011, International Conference on Optical, Electronic Materials and Applications, ChongQing, China.
04 - 06 Mar 2011.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Zinc sulfide (ZnS) waveguides with the thickness of 0.5 µm have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = –50°C) and ambient temperature (Tambient = 25°C) by thermal evaporation technique. The propagation losses of ZnS waveguides were determined by a scattering detection method. The propagation losses of cold deposited ZnS waveguide were 20.41, 11.35, 3.51 and 2.30 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. Where as, the propagation losses of ambient deposited ZnS waveguide were 131.50, 47.99, 4.43 and 2.74 dB/cm measured the wavelengths of 633, 986, 1305 and 1540 nm, respectively. The propagation loss of the cold deposited ZnS waveguide was dominated by surface scattering whereas the propagation loss of the ambient deposited ZnS waveguide was dominated by bulk scattering.
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OEMA2011_Saafie_Salleh-4Nov2010.pdf
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e-pub ahead of print date: March 2011
Venue - Dates:
OEMA2011, International Conference on Optical, Electronic Materials and Applications, ChongQing, China, 2011-03-04 - 2011-03-06
Keywords:
cold deposition, waveguide, zinc sulfide, propagation loss
Organisations:
Optoelectronics Research Centre, Electronics & Computer Science
Identifiers
Local EPrints ID: 271674
URI: http://eprints.soton.ac.uk/id/eprint/271674
PURE UUID: 10e69af3-1589-43f7-8e22-2be982f0862a
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Date deposited: 04 Nov 2010 08:49
Last modified: 14 Mar 2024 09:37
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Contributors
Author:
S. Salleh
Author:
M.N. Dalimin
Author:
H.N. Rutt
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