Koukharenko, Elena, Frety, N, Shepelevich, VG and Tedenac, JC (2003) Electrical and microstructural properties of Bi2-xSbxTe and Bix-xSbxTe2 thin foils obtained by the ultrarapid quenching process. Journal of Materials Science: Materials in Electronics, 14, 383-388. (doi:10.1023/A:1023956819190).
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Published date: 2003
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EEE
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Local EPrints ID: 271728
URI: http://eprints.soton.ac.uk/id/eprint/271728
PURE UUID: b64a59aa-1ed0-40b8-9c03-66726977f179
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Date deposited: 30 Nov 2010 15:50
Last modified: 14 Mar 2024 09:37
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Author:
Elena Koukharenko
Author:
N Frety
Author:
VG Shepelevich
Author:
JC Tedenac
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