Modelling of Partial Discharge Activity in a Cavity within a Dielectric Insulation Material
Modelling of Partial Discharge Activity in a Cavity within a Dielectric Insulation Material
The pattern of partial discharge (PD) occurrence at a defect site within a solid dielectric material is influenced by the conditions of the defect site. This is because the defect conditions such as its size and location determine the electric field distributions at the defect site which influence the patterns of PD occurrence. A model for a spherical cavity and ellipsoidal cavity within a homogeneous dielectric material has been developed by using Finite Element Analysis (FEA) software. The model is used to study the influence of different conditions of the cavity on the electric field distribution in the cavity and the PD activity. Also, experimental measurements of PD in spherical cavity and ellipsoidal cavity of different size within a dielectric material are detailed.
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Bai, Tianyu
b791a739-1ae4-4274-be6d-616c52b87d89
Swaffield, D J
31f6f52e-fb48-44f9-99d3-3cbd2539f1b9
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
18 January 2011
Bai, Tianyu
b791a739-1ae4-4274-be6d-616c52b87d89
Swaffield, D J
31f6f52e-fb48-44f9-99d3-3cbd2539f1b9
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Bai, Tianyu, Swaffield, D J and Lewin, P L
(2011)
Modelling of Partial Discharge Activity in a Cavity within a Dielectric Insulation Material.
UHVnet 2011, Winchester, United Kingdom.
18 - 19 Jan 2011.
.
Record type:
Conference or Workshop Item
(Poster)
Abstract
The pattern of partial discharge (PD) occurrence at a defect site within a solid dielectric material is influenced by the conditions of the defect site. This is because the defect conditions such as its size and location determine the electric field distributions at the defect site which influence the patterns of PD occurrence. A model for a spherical cavity and ellipsoidal cavity within a homogeneous dielectric material has been developed by using Finite Element Analysis (FEA) software. The model is used to study the influence of different conditions of the cavity on the electric field distribution in the cavity and the PD activity. Also, experimental measurements of PD in spherical cavity and ellipsoidal cavity of different size within a dielectric material are detailed.
Text
Baitianyu_Paper_017.pdf
- Version of Record
Slideshow
T_Bai_-_UHVnet2011_-_Poster.ppt
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More information
Published date: 18 January 2011
Additional Information:
Event Dates: 18-19 January 2011
Venue - Dates:
UHVnet 2011, Winchester, United Kingdom, 2011-01-18 - 2011-01-19
Organisations:
Electronics & Computer Science, EEE
Identifiers
Local EPrints ID: 271864
URI: http://eprints.soton.ac.uk/id/eprint/271864
PURE UUID: b87dd9e7-3731-4107-a9c0-93942b812d61
Catalogue record
Date deposited: 04 Jan 2011 20:39
Last modified: 15 Mar 2024 02:43
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Contributors
Author:
Tianyu Bai
Author:
D J Swaffield
Author:
P L Lewin
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