Halak, Basel and Yakovlev, Alex (2011) Statistical analysis of crosstalk-induced errors for on-chip interconnects. IET Computers & Digital Techniques, 5 (2).
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Published date: 2011
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EEE
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Local EPrints ID: 272150
URI: http://eprints.soton.ac.uk/id/eprint/272150
PURE UUID: 6268dabf-df2a-44df-88b8-a64d2553a00c
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Date deposited: 06 Apr 2011 10:19
Last modified: 15 Mar 2024 03:39
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Author:
Basel Halak
Author:
Alex Yakovlev
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