The use of confocal Raman and FTIR spectroscopy for analysis of nanosilica composites

Abstract

The potential of polymeric nanocomposites in solid insulation systems has grown exponentially since the early 1990s and has been a topic of great discussion. With increasing quantities of experimental data, the option to engineer materials and optimise desired properties is being addressed. However, many of the fundamentals aspects of this class of materials, such as their long term electrical behaviour, remains relatively unexplored. Whilst the nature of the interfacial regions within such systems is believed to be key in determining many aspects of dielectric performance, further investigation is required in order better to understand the macroscopic behaviour of nanocomposites. Such studies are vital for fundamental change, bringing an alternative to polymer blends and typical filled polymers and making a massive impact on industry. This paper concerns the dielectric interfaces in nanodielectrics and sets out to explore the effect of quantified changes in interfacial interactions between the nanoparticulate and matrix phases. Specifically, we have used confocal Raman microscopy and Fourier Transform Infrared spectroscopy to examine and characterise the relevant effects of modifying the surface chemistry of nanosilica using silane chemistry. By introducing these different degrees of functionalised nanosilicas into a matrix of epoxy resin, we have produced a series of nanocomposite systems and have examined how interfacial interactions affect the behaviour of the system. In this paper, we particularly address the topic of interfacial chemistry, processing methodology and breakdown behaviour.

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ORCID for Alun Vaughan: orcid.org/0000-0002-0535-513X

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