Beam-induced damage to graphene in the helium ion microscope
Beam-induced damage to graphene in the helium ion microscope
Boden, Stuart
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Moktadir, Zakaria
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Bagnall, Darren
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Rutt, Harvey
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Mizuta, Hiroshi
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Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Moktadir, Zakaria
34472668-ffda-4287-8fea-2c4f3bf1e2fa
Bagnall, Darren
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Rutt, Harvey
e09fa327-0c01-467a-9898-4e7f0cd715fc
Mizuta, Hiroshi
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Boden, Stuart, Moktadir, Zakaria, Bagnall, Darren, Rutt, Harvey and Mizuta, Hiroshi
(2011)
Beam-induced damage to graphene in the helium ion microscope.
Graphene 2011 Conference, Bilbao, Spain.
11 - 14 Apr 2011.
(In Press)
Record type:
Conference or Workshop Item
(Paper)
Text
Graphene2011_Boden_Stuart_sb1@ecs.soton.ac.uk_Imaginenano2011_Abstract_SABoden.pdf
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More information
Accepted/In Press date: 19 May 2011
Additional Information:
Event Dates: 11-14 April 2011
Venue - Dates:
Graphene 2011 Conference, Bilbao, Spain, 2011-04-11 - 2011-04-14
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 272304
URI: http://eprints.soton.ac.uk/id/eprint/272304
PURE UUID: d23bc5f5-ddfc-48b6-9762-c1dfb6dfff79
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Date deposited: 19 May 2011 09:03
Last modified: 15 Mar 2024 03:21
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Contributors
Author:
Stuart Boden
Author:
Zakaria Moktadir
Author:
Darren Bagnall
Author:
Harvey Rutt
Author:
Hiroshi Mizuta
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