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Beam-induced damage to graphene in the helium ion microscope

Beam-induced damage to graphene in the helium ion microscope
Beam-induced damage to graphene in the helium ion microscope
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Moktadir, Zakaria
34472668-ffda-4287-8fea-2c4f3bf1e2fa
Bagnall, Darren
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Rutt, Harvey
e09fa327-0c01-467a-9898-4e7f0cd715fc
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Moktadir, Zakaria
34472668-ffda-4287-8fea-2c4f3bf1e2fa
Bagnall, Darren
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Rutt, Harvey
e09fa327-0c01-467a-9898-4e7f0cd715fc
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9

Boden, Stuart, Moktadir, Zakaria, Bagnall, Darren, Rutt, Harvey and Mizuta, Hiroshi (2011) Beam-induced damage to graphene in the helium ion microscope. Graphene 2011 Conference, Spain. 11 - 14 Apr 2011. (In Press)

Record type: Conference or Workshop Item (Paper)
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Graphene2011_Boden_Stuart_sb1@ecs.soton.ac.uk_Imaginenano2011_Abstract_SABoden.pdf - Other
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More information

Accepted/In Press date: 19 May 2011
Additional Information: Event Dates: 11-14 April 2011
Venue - Dates: Graphene 2011 Conference, Spain, 2011-04-11 - 2011-04-14
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 272304
URI: https://eprints.soton.ac.uk/id/eprint/272304
PURE UUID: d23bc5f5-ddfc-48b6-9762-c1dfb6dfff79
ORCID for Stuart Boden: ORCID iD orcid.org/0000-0002-4232-1828

Catalogue record

Date deposited: 19 May 2011 09:03
Last modified: 06 Jun 2018 12:43

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