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Raman Microprobe Analysis of Electrical Treeing in Silicone Rubber

Raman Microprobe Analysis of Electrical Treeing in Silicone Rubber
Raman Microprobe Analysis of Electrical Treeing in Silicone Rubber
Previous papers have identified Raman microprobe analysis as a useful tool in the chemical analysis of electrical trees and have successfully applied the technique to trees grown in polyethylene. This paper comprises a detailed spectroscopic study of electrical trees grown in silicone rubber. A selection of trees of varying fractal dimensions were exposed using cryogenic microtomy and then the individual tree channels were subjected to surface specific Raman microprobe analysis. It was found that although some trees show that few chemical changes have occurred, some trees (including some where complete breakdown has occurred) show evidence of the presence of silica and carbon, the latter possibly originating from the side groups of the polymer chain. After this, some of the samples were then analyzed using scanning electron microscopy (SEM) to provide an alternative method of analysis and to reinforce the conclusions made. Results are discussed in comparison to previously published results from a similar analysis on trees in polyethylene.
CD-ROM
Freebody, N A
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Hosier, I L
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Vaughan, A S
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Freebody, N A
fdec3bc9-0399-43bb-83a3-b099dd431c3f
Hosier, I L
6a44329e-b742-44de-afa7-073f80a78e26
Vaughan, A S
6d813b66-17f9-4864-9763-25a6d659d8a3

Freebody, N A, Hosier, I L and Vaughan, A S (2011) Raman Microprobe Analysis of Electrical Treeing in Silicone Rubber. 17th International Symposium on High Voltage Engineering, Hannover, Germany. 21 - 25 Aug 2011. CD-ROM .

Record type: Conference or Workshop Item (Paper)

Abstract

Previous papers have identified Raman microprobe analysis as a useful tool in the chemical analysis of electrical trees and have successfully applied the technique to trees grown in polyethylene. This paper comprises a detailed spectroscopic study of electrical trees grown in silicone rubber. A selection of trees of varying fractal dimensions were exposed using cryogenic microtomy and then the individual tree channels were subjected to surface specific Raman microprobe analysis. It was found that although some trees show that few chemical changes have occurred, some trees (including some where complete breakdown has occurred) show evidence of the presence of silica and carbon, the latter possibly originating from the side groups of the polymer chain. After this, some of the samples were then analyzed using scanning electron microscopy (SEM) to provide an alternative method of analysis and to reinforce the conclusions made. Results are discussed in comparison to previously published results from a similar analysis on trees in polyethylene.

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More information

Published date: 22 August 2011
Additional Information: Event Dates: 22-26 August 2011
Venue - Dates: 17th International Symposium on High Voltage Engineering, Hannover, Germany, 2011-08-21 - 2011-08-25
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 272718
URI: http://eprints.soton.ac.uk/id/eprint/272718
PURE UUID: 3523be22-a629-4341-8a4d-f92dbc016aab
ORCID for I L Hosier: ORCID iD orcid.org/0000-0003-4365-9385
ORCID for A S Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 25 Aug 2011 07:23
Last modified: 01 Oct 2020 01:35

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Contributors

Author: N A Freebody
Author: I L Hosier ORCID iD
Author: A S Vaughan ORCID iD

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