Yin, Weijun, Tao, Fengfeng, Zhao, Junwei, Chen, George and Schweickart, Daniel
Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses
At IEEE International Power Modulator and High Voltage Conference, United States.
23 - 27 May 2010.
Breakdown behaviors of polyimide and perfluoroalkoxy high temperature films under unipolar and bipolar repetitive pulses are investigated. A bipolar 20kV, 20 kHz and fast dV/dt pulse generator has been designed and built to study the impact of pulse frequency, pulse rise time, and pulse polarity and pulse duty cycles on breakdown strength of these films films. Space charge injection and decay processes are also investigated. Possible failure mechanisms are discussed.
Conference or Workshop Item
||Event Dates: May 23 - 27, 2010
|Venue - Dates:
||IEEE International Power Modulator and High Voltage Conference, United States, 2010-05-23 - 2010-05-27
||Electronics & Computer Science
|23 May 2010||Published|
||23 Feb 2012 14:49
||17 Apr 2017 17:32
|Further Information:||Google Scholar|
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