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Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses

Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses
Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses
Breakdown behaviors of polyimide and perfluoroalkoxy high temperature films under unipolar and bipolar repetitive pulses are investigated. A bipolar 20kV, 20 kHz and fast dV/dt pulse generator has been designed and built to study the impact of pulse frequency, pulse rise time, and pulse polarity and pulse duty cycles on breakdown strength of these films films. Space charge injection and decay processes are also investigated. Possible failure mechanisms are discussed.
45-50
Yin, Weijun
c982abf3-0293-4d0e-92c1-8cebb8097040
Tao, Fengfeng
e1295bfe-5cb1-45e2-a1f0-ed45d4040ebd
Zhao, Junwei
b3fc6668-bcfd-4ba3-8c44-809cc7f26727
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Schweickart, Daniel
5ffbc887-f81f-4313-b071-da452ba4771c
Yin, Weijun
c982abf3-0293-4d0e-92c1-8cebb8097040
Tao, Fengfeng
e1295bfe-5cb1-45e2-a1f0-ed45d4040ebd
Zhao, Junwei
b3fc6668-bcfd-4ba3-8c44-809cc7f26727
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Schweickart, Daniel
5ffbc887-f81f-4313-b071-da452ba4771c

Yin, Weijun, Tao, Fengfeng, Zhao, Junwei, Chen, George and Schweickart, Daniel (2010) Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses. IEEE International Power Modulator and High Voltage Conference, Atkanta, GA, United States. 22 - 26 May 2010. pp. 45-50 .

Record type: Conference or Workshop Item (Paper)

Abstract

Breakdown behaviors of polyimide and perfluoroalkoxy high temperature films under unipolar and bipolar repetitive pulses are investigated. A bipolar 20kV, 20 kHz and fast dV/dt pulse generator has been designed and built to study the impact of pulse frequency, pulse rise time, and pulse polarity and pulse duty cycles on breakdown strength of these films films. Space charge injection and decay processes are also investigated. Possible failure mechanisms are discussed.

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More information

Published date: 23 May 2010
Additional Information: Event Dates: May 23 - 27, 2010
Venue - Dates: IEEE International Power Modulator and High Voltage Conference, Atkanta, GA, United States, 2010-05-22 - 2010-05-26
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 273231
URI: http://eprints.soton.ac.uk/id/eprint/273231
PURE UUID: c38717c5-4b06-4bee-b49b-d34e77c3a503

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Date deposited: 23 Feb 2012 14:49
Last modified: 06 Oct 2020 23:21

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