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The effect of grain boundary sliding and strain rate sensitivity on the ductility of ultrafine-grained materials

Record type: Conference or Workshop Item (Paper)

Most ultrafine-grained (UFG) materials produced by severe plastic deformation (SPD) exibit only limited ductility which is correlated with the low strain rate sensitivity (SRS) of these materials. Recently, it was demonstrated that SPD is capable of increasing the room temperature ductility of aluminum-based alloys attaining elongations up to 150%, together with relatively high strain rate sensitivity. In the present work, additional results and discussions are presented on the effect of grain boundary sliding (GBS) and SRS on the ductility of some UFG metals and alloys. The characteristics of constitutive equations describing the steady-state deformation process are quantitatively analyzed for a better understanding of the effects of grain boundaries and strain rate sensitivity

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Citation

Chinh, N Q, Langdon, T.G., Csanádi, T., Gubicza, J., Valiev, R.Z. and . Straumal, B.B., (2010) The effect of grain boundary sliding and strain rate sensitivity on the ductility of ultrafine-grained materials Wang, Jing Tao, Figueiredo, Roberto B. and Langdon, Terence G. (eds.) In Nanomaterials by Severe Plastic Deformation: NanoSPD5. vol. 667-669, Trans Tech., pp. 677-682. (doi:10.4028/www.scientific.net/MSF.667-669.677).

More information

Published date: December 2010
Venue - Dates: 5th International Conference on Nanomaterials by Severe Plastic Deformation, 2011-03-21 - 2011-03-25
Organisations: Bioengineering Group

Identifiers

Local EPrints ID: 300784
URI: http://eprints.soton.ac.uk/id/eprint/300784
ISBN: 978-3-03785-007-7
PURE UUID: 87895d06-4369-4b40-85e3-d6f7639b25d4
ORCID for T.G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

Catalogue record

Date deposited: 29 Feb 2012 12:04
Last modified: 18 Jul 2017 06:14

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Contributors

Author: N Q Chinh
Author: T.G. Langdon ORCID iD
Author: T. Csanádi
Author: J. Gubicza
Author: R.Z. Valiev
Author: B.B. . Straumal
Editor: Jing Tao Wang
Editor: Roberto B. Figueiredo
Editor: Terence G. Langdon

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