Speckle pattern characterisation for high resolution digital image correlation

Crammond, G., Boyd, S.W. and Dulieu-Barton, J.M. (2011) Speckle pattern characterisation for high resolution digital image correlation Applied Mechanics and Materials, 70, pp. 261-266. (doi:10.4028/www.scientific.net/AMM.70.261).


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Digital image correlation (DIC) is an optical technique for full field deformation measurement. The spatial resolution and precision of the measurements are limited by the number of pixels within the image. The use of magnifying optics provides greater spatial resolution images, enabling smaller displacements to be observed with greater accuracy. Increasing the magnification of an image significantly changes the appearance of the non-periodic, stochastic speckle pattern which provides the grey scale contrast necessary for the image correlation method. In the paper a methodology is developed to evaluate the properties of different speckle pattern types under a range of resolutions up to 1027 pixel / mm. Numerical deformation of the patterns is also undertaken to evaluate how the changes in the pattern properties affect the accuracy of the DIC measurements.

Item Type: Article
Digital Object Identifier (DOI): doi:10.4028/www.scientific.net/AMM.70.261
ISSNs: 1660-9336 (print)
Related URLs:
Organisations: Engineering Science Unit
ePrint ID: 338766
Date :
Date Event
August 2011Published
Date Deposited: 17 May 2012 10:47
Last Modified: 17 Apr 2017 17:09
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/338766

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