Managing variability in 40NM and 28NM designs
Managing variability in 40NM and 28NM designs
This article presents a study of variability-aware design methodology that allows designers to lower the risks of silicon failure and to improve their design margins and flows. Supplied by a group of researchers and engineers at CSR, the University of Southampton and Cadence Design Systems.
34-39
Wang, Yangang
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Zwolinski, Mark
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Appleby, Andrew
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Scoones, Mark
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Caldwell, Sonia
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Azam, Touqeer
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Hurat, Philippe
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Pitchford, Chris
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April 2012
Wang, Yangang
84511804-36d1-44c7-90d4-a18201735a08
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Appleby, Andrew
ebb63f5c-dce0-470f-9753-1ffd9f37f95e
Scoones, Mark
48700f9c-e139-4043-a6fc-38bbe0185aa6
Caldwell, Sonia
aecc7838-001e-4b51-8ece-dab3d6b91a62
Azam, Touqeer
624d84ab-3a51-40af-9962-d331b6235ca2
Hurat, Philippe
d10ef70f-904c-4a5e-8d73-2a6f2db4dc51
Pitchford, Chris
706b5444-3f66-4cdb-bc3e-0ec20988d414
Wang, Yangang, Zwolinski, Mark, Appleby, Andrew, Scoones, Mark, Caldwell, Sonia, Azam, Touqeer, Hurat, Philippe and Pitchford, Chris
(2012)
Managing variability in 40NM and 28NM designs.
Electronics World, 118 (1912), .
Abstract
This article presents a study of variability-aware design methodology that allows designers to lower the risks of silicon failure and to improve their design margins and flows. Supplied by a group of researchers and engineers at CSR, the University of Southampton and Cadence Design Systems.
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More information
Published date: April 2012
Organisations:
EEE
Identifiers
Local EPrints ID: 339235
URI: http://eprints.soton.ac.uk/id/eprint/339235
ISSN: 0959-8332
PURE UUID: 6a674e01-67a2-4430-9a3d-739036154e2e
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Date deposited: 28 May 2012 10:38
Last modified: 11 Dec 2021 02:44
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Contributors
Author:
Yangang Wang
Author:
Mark Zwolinski
Author:
Andrew Appleby
Author:
Mark Scoones
Author:
Sonia Caldwell
Author:
Touqeer Azam
Author:
Philippe Hurat
Author:
Chris Pitchford
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