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Origin of thickness dependent dc electrical breakdown in dielectrics

Origin of thickness dependent dc electrical breakdown in dielectrics
Origin of thickness dependent dc electrical breakdown in dielectrics
A model based on space charge dynamics under high dc electric field has been proposed to explain commonly observed thickness dependent breakdown of polymeric material. The formation and dynamics of space charge will result in local electric field enhancement that has a direct impact on dielectric breakdown. The simulation results show that the breakdown depends on the sample thickness with a power index of 0.143, indicating the space charge and its dynamics are responsible for thickness dependent breakdown. The model also predicts the effect of voltage ramping rate on the electrical breakdown strength.
0003-6951
222904-[4 pages]
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Zhao, J
ccf4084e-9736-4a9a-8a46-92a83257bca7
Li, Shengtao
e2d199c9-1c0c-40c8-aefb-ff3b3d8e4799
Zhong, Lisheng
255706e0-8092-4cac-a05b-94167a66729a
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Zhao, J
ccf4084e-9736-4a9a-8a46-92a83257bca7
Li, Shengtao
e2d199c9-1c0c-40c8-aefb-ff3b3d8e4799
Zhong, Lisheng
255706e0-8092-4cac-a05b-94167a66729a

Chen, G, Zhao, J, Li, Shengtao and Zhong, Lisheng (2012) Origin of thickness dependent dc electrical breakdown in dielectrics. Applied Physics Letters, 100 (22), 222904-[4 pages]. (doi:10.1063/1.4721809).

Record type: Article

Abstract

A model based on space charge dynamics under high dc electric field has been proposed to explain commonly observed thickness dependent breakdown of polymeric material. The formation and dynamics of space charge will result in local electric field enhancement that has a direct impact on dielectric breakdown. The simulation results show that the breakdown depends on the sample thickness with a power index of 0.143, indicating the space charge and its dynamics are responsible for thickness dependent breakdown. The model also predicts the effect of voltage ramping rate on the electrical breakdown strength.

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Published date: 31 May 2012
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Organisations: EEE

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Local EPrints ID: 340036
URI: http://eprints.soton.ac.uk/id/eprint/340036
DOI: doi:10.1063/1.4721809
ISSN: 0003-6951
PURE UUID: 1b00379b-cb2f-44f3-b61a-0b221064808f

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Date deposited: 07 Jun 2012 12:39
Last modified: 14 Mar 2024 11:18

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Contributors

Author: G Chen
Author: J Zhao
Author: Shengtao Li
Author: Lisheng Zhong

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