Alignment of Ontology Design Patterns: Class As Property Value, Value Partition and Normalisation
Alignment of Ontology Design Patterns: Class As Property Value, Value Partition and Normalisation
Design-pattern driven ontology construction, whether manual or (partially) automated, relies on the availability of curated repositories of Ontology Design Patterns (ODPs) adequately characterized. In order to consistently apply a given ODP, not only it is important to characterize it in full, but also examine its alignment or deviation to other relevant ODPs in relation to it. Otherwise, possible inconsistencies in the application can lead to interoperability issues among the ontology models involved.
In that context, this paper revisits a specific version of three different ODPs: Class as a Property Value (CPV), Value Partition (VP) and Normalisation. The review of the CPV identifies two distinct modelling problems being tangled that prompt to decouple the pattern into two variants: a strict and a coarse CPV pattern. The examination continues with a comparative analysis among the patterns that reveals key alignments and differences at the structural and semantic level. These findings extends the reusability and compositional characteristics of the strict and coarse variants of the CPV ODP in relation to the other two patterns.
To illustrate our contribution existing examples in the literature are revisited. They demonstrate the alignments, differences and prototypical OWL idioms identified, which can assist ontology practitioners in mitigating the opportunity for inconsistencies when applying these recurrent ontology building blocks.
Rodriguez-Castro, Bene
bfab723f-6e79-4b04-b950-9ba362b1c562
Ge, Mouzhi
afba7fe0-9532-4728-8062-b68b6c366e66
Hepp, Martin
335f0432-635b-4f90-b80b-4dfe2db0b77a
Rodriguez-Castro, Bene
bfab723f-6e79-4b04-b950-9ba362b1c562
Ge, Mouzhi
afba7fe0-9532-4728-8062-b68b6c366e66
Hepp, Martin
335f0432-635b-4f90-b80b-4dfe2db0b77a
Rodriguez-Castro, Bene, Ge, Mouzhi and Hepp, Martin
(2012)
Alignment of Ontology Design Patterns: Class As Property Value, Value Partition and Normalisation.
The 11th International Conference on Ontologies, DataBases, and Applications of Semantics (ODBASE).
18 pp
.
(In Press)
Record type:
Conference or Workshop Item
(Paper)
Abstract
Design-pattern driven ontology construction, whether manual or (partially) automated, relies on the availability of curated repositories of Ontology Design Patterns (ODPs) adequately characterized. In order to consistently apply a given ODP, not only it is important to characterize it in full, but also examine its alignment or deviation to other relevant ODPs in relation to it. Otherwise, possible inconsistencies in the application can lead to interoperability issues among the ontology models involved.
In that context, this paper revisits a specific version of three different ODPs: Class as a Property Value (CPV), Value Partition (VP) and Normalisation. The review of the CPV identifies two distinct modelling problems being tangled that prompt to decouple the pattern into two variants: a strict and a coarse CPV pattern. The examination continues with a comparative analysis among the patterns that reveals key alignments and differences at the structural and semantic level. These findings extends the reusability and compositional characteristics of the strict and coarse variants of the CPV ODP in relation to the other two patterns.
To illustrate our contribution existing examples in the literature are revisited. They demonstrate the alignments, differences and prototypical OWL idioms identified, which can assist ontology practitioners in mitigating the opportunity for inconsistencies when applying these recurrent ontology building blocks.
Text
rodriguez-castro-odbase2012-rev813.pdf
- Version of Record
More information
Accepted/In Press date: 2012
Venue - Dates:
The 11th International Conference on Ontologies, DataBases, and Applications of Semantics (ODBASE), 2012-01-01
Organisations:
Web & Internet Science
Identifiers
Local EPrints ID: 340589
URI: http://eprints.soton.ac.uk/id/eprint/340589
PURE UUID: b6f5e74e-2ed9-46a6-9362-e31fc7883fd1
Catalogue record
Date deposited: 26 Jun 2012 11:49
Last modified: 14 Mar 2024 11:26
Export record
Contributors
Author:
Bene Rodriguez-Castro
Author:
Mouzhi Ge
Author:
Martin Hepp
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics