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90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques

90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques
90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques
The use of short wavelength sources for microscopy increases resolution via the diffraction limit, and allows the variation in optical contrast, such as that between carbon and water in the 2-4nm regime, to facilitate useful imaging. However, high material absorption and consequent low phase shift, at such wavelengths limit the availability of focussing optics. For coherent illumination, the electric field just after an object can be reconstructed from its far field diffraction pattern by the process of Coherent Diffractive Imaging (CDI), which solves the well-known phase retrieval problem by iteratively applying constraints in the object and far field (Fourier) planes. Synchrotron sources have achieved 3nm resolution using this technique [1].
Parsons, Aaron D.
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Chapman, Richard T.
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Mills, Benjamin
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Butcher, Thomas J.
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Frey, Jeremy G.
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Brocklesby, William S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Parsons, Aaron D.
4233ec59-883d-433b-ac17-6fd7a3fafa8b
Chapman, Richard T.
8a9fe0e2-c408-4188-bf10-e93bf247205c
Mills, Benjamin
05f1886e-96ef-420f-b856-4115f4ab36d0
Butcher, Thomas J.
77bed03c-ae8f-4e12-8c35-974150a7cc2d
Frey, Jeremy G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Brocklesby, William S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67

Parsons, Aaron D., Chapman, Richard T., Mills, Benjamin, Butcher, Thomas J., Frey, Jeremy G. and Brocklesby, William S. (2011) 90 nm resolution reconstruction from a polychromatic signal using monochromatic phase retrieval techniques. European Conference on Lasers and Electro-Optics, Germany. 22 - 26 May 2011.

Record type: Conference or Workshop Item (Paper)

Abstract

The use of short wavelength sources for microscopy increases resolution via the diffraction limit, and allows the variation in optical contrast, such as that between carbon and water in the 2-4nm regime, to facilitate useful imaging. However, high material absorption and consequent low phase shift, at such wavelengths limit the availability of focussing optics. For coherent illumination, the electric field just after an object can be reconstructed from its far field diffraction pattern by the process of Coherent Diffractive Imaging (CDI), which solves the well-known phase retrieval problem by iteratively applying constraints in the object and far field (Fourier) planes. Synchrotron sources have achieved 3nm resolution using this technique [1].

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e-pub ahead of print date: 2011
Additional Information: CD.P.35
Venue - Dates: European Conference on Lasers and Electro-Optics, Germany, 2011-05-22 - 2011-05-26
Organisations: Optoelectronics Research Centre, Chemistry, Physics & Astronomy

Identifiers

Local EPrints ID: 341437
URI: http://eprints.soton.ac.uk/id/eprint/341437
PURE UUID: fb11b3ff-d4b0-4b20-babf-7556d2b71c53
ORCID for Benjamin Mills: ORCID iD orcid.org/0000-0002-1784-1012
ORCID for Jeremy G. Frey: ORCID iD orcid.org/0000-0003-0842-4302
ORCID for William S. Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712

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Date deposited: 25 Jul 2012 11:06
Last modified: 18 Feb 2021 17:08

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Contributors

Author: Aaron D. Parsons
Author: Richard T. Chapman
Author: Benjamin Mills ORCID iD
Author: Thomas J. Butcher
Author: Jeremy G. Frey ORCID iD

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