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Direct refractive index measurement technique to observe waveguide dispersion

Direct refractive index measurement technique to observe waveguide dispersion
Direct refractive index measurement technique to observe waveguide dispersion
Measuring the dispersion characteristics of a planar waveguide is typically difficult due to the short lengths of waveguides involved. Traditional dispersion measurement techniques were developed in fibre [1] and bulk glass [2], and thus do not take into account the intricacies of the short planar waveguide. The fibre techniques typically require far more material than is available in a short planar waveguide, resulting in an imprecise measurement. The bulk measurement techniques do not take into account the specific structure and dimensions of the waveguide under test, so again do not provide a realistic interpretation of the dispersion characteristics of a specific waveguide.
Rogers, Helen
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Holmes, Christopher
16306bb8-8a46-4fd7-bb19-a146758e5263
Gates, James C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Smith, Peter G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6
Rogers, Helen
c6b6aa89-b14c-48b6-92c0-dd5c5bca683c
Holmes, Christopher
16306bb8-8a46-4fd7-bb19-a146758e5263
Gates, James C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Smith, Peter G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6

Rogers, Helen, Holmes, Christopher, Gates, James C. and Smith, Peter G.R. (2011) Direct refractive index measurement technique to observe waveguide dispersion. European Conference on Lasers and Electro-Optics, Munich, Germany. 22 - 26 May 2011.

Record type: Conference or Workshop Item (Paper)

Abstract

Measuring the dispersion characteristics of a planar waveguide is typically difficult due to the short lengths of waveguides involved. Traditional dispersion measurement techniques were developed in fibre [1] and bulk glass [2], and thus do not take into account the intricacies of the short planar waveguide. The fibre techniques typically require far more material than is available in a short planar waveguide, resulting in an imprecise measurement. The bulk measurement techniques do not take into account the specific structure and dimensions of the waveguide under test, so again do not provide a realistic interpretation of the dispersion characteristics of a specific waveguide.

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More information

e-pub ahead of print date: 2011
Additional Information: CE1.1
Venue - Dates: European Conference on Lasers and Electro-Optics, Munich, Germany, 2011-05-22 - 2011-05-26
Organisations: Optoelectronics Research Centre, Physics & Astronomy, Electronics & Computer Science

Identifiers

Local EPrints ID: 341527
URI: https://eprints.soton.ac.uk/id/eprint/341527
PURE UUID: 9cf7796c-3c20-42a7-91d7-fa3751a0d5e0
ORCID for James C. Gates: ORCID iD orcid.org/0000-0001-8671-5987

Catalogue record

Date deposited: 26 Jul 2012 12:17
Last modified: 20 Jul 2019 01:06

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