Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings
Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings
We demonstrate experimentally a simple technique to measure the wavelength-dependent effective refractive index of a waveguide utilizing integrated Bragg grating structures. A broadband measurement of the Bragg wavelengths yields the effective index of the waveguide and, thus, an accurate total dispersion relationship. An empirical calculation of the waveguide component of the dispersion yields both the waveguide and material dispersion components of the measured total dispersion. The technique allows direct measurement of the effective index of the waveguide and yields a zero dispersion wavelength at 1220.5 nm in our silica-on-silicon platform. Importantly, inclusion of second-order Bragg reflections improves the accuracy of modal refractive index for near-visible wavelengths.
310-316
Rogers, H.L.
c6b6aa89-b14c-48b6-92c0-dd5c5bca683c
Holmes, C.
16306bb8-8a46-4fd7-bb19-a146758e5263
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6
April 2012
Rogers, H.L.
c6b6aa89-b14c-48b6-92c0-dd5c5bca683c
Holmes, C.
16306bb8-8a46-4fd7-bb19-a146758e5263
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6
Rogers, H.L., Holmes, C., Gates, J.C. and Smith, P.G.R.
(2012)
Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings.
IEEE Photonics Journal, 4 (2), .
(doi:10.1109/JPHOT.2012.2186794).
Abstract
We demonstrate experimentally a simple technique to measure the wavelength-dependent effective refractive index of a waveguide utilizing integrated Bragg grating structures. A broadband measurement of the Bragg wavelengths yields the effective index of the waveguide and, thus, an accurate total dispersion relationship. An empirical calculation of the waveguide component of the dispersion yields both the waveguide and material dispersion components of the measured total dispersion. The technique allows direct measurement of the effective index of the waveguide and yields a zero dispersion wavelength at 1220.5 nm in our silica-on-silicon platform. Importantly, inclusion of second-order Bragg reflections improves the accuracy of modal refractive index for near-visible wavelengths.
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Published date: April 2012
Organisations:
Optoelectronics Research Centre, Physics & Astronomy, Electronics & Computer Science
Identifiers
Local EPrints ID: 341555
URI: http://eprints.soton.ac.uk/id/eprint/341555
ISSN: 1943-0655
PURE UUID: 183adbb7-4cbf-4da4-8e4c-f8552098a182
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Date deposited: 27 Jul 2012 10:22
Last modified: 15 Mar 2024 03:27
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Contributors
Author:
H.L. Rogers
Author:
J.C. Gates
Author:
P.G.R. Smith
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