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Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings

Rogers, H.L., Holmes, C., Gates, J.C. and Smith, P.G.R. (2012) Analysis of dispersion characteristics of planar waveguides via multi-order interrogation of integrated Bragg gratings IEEE Photonics Journal, 4, (2), pp. 310-316.

Record type: Article

Abstract

We demonstrate experimentally a simple technique to measure the wavelength-dependent effective refractive index of a waveguide utilizing integrated Bragg grating structures. A broadband measurement of the Bragg wavelengths yields the effective index of the waveguide and, thus, an accurate total dispersion relationship. An empirical calculation of the waveguide component of the dispersion yields both the waveguide and material dispersion components of the measured total dispersion. The technique allows direct measurement of the effective index of the waveguide and yields a zero dispersion wavelength at 1220.5 nm in our silica-on-silicon platform. Importantly, inclusion of second-order Bragg reflections improves the accuracy of modal refractive index for near-visible wavelengths

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More information

Published date: 2012
Organisations: Optoelectronics Research Centre, Physics & Astronomy, Electronics & Computer Science

Identifiers

Local EPrints ID: 341555
URI: http://eprints.soton.ac.uk/id/eprint/341555
ISSN: 1943-0655
PURE UUID: 183adbb7-4cbf-4da4-8e4c-f8552098a182
ORCID for J.C. Gates: ORCID iD orcid.org/0000-0001-8671-5987

Catalogue record

Date deposited: 27 Jul 2012 10:22
Last modified: 13 Oct 2017 12:09

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Contributors

Author: H.L. Rogers
Author: C. Holmes
Author: J.C. Gates ORCID iD
Author: P.G.R. Smith

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