Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy
Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy
We use helium ion microscopy (HeIM) to image the nanostructure of poly(3-hexylthiophene)/[6,6]-phenyl-C61-butric acid methyl ester (P3HT/PCBM) blend thin-films. Specifically, we study a blend thin-film subject to a thermal anneal at 140 °C and use a plasma-etching technique to gain access to the bulk of the blend thin-films. We observe a domain structure within the bulk of the film that is not apparent at the film-surface and tentatively identify a network of slightly elongated PCBM domains having a spatial periodicity of (20 ± 4) nm a length of (12 ± 8) nm
4275-4281
Pearson, Andrew J.
ce93018b-4c08-4a2e-84b9-67ee37f86d63
Boden, Stuart Andrew
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Bagnall, Darren M.
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Lidzey, David G.
4c1f0189-29db-482f-896b-b90f28909baf
Rodenburg, Cornelia
b3890cb2-387c-40b9-a74a-05b8bcb3eda9
16 September 2011
Pearson, Andrew J.
ce93018b-4c08-4a2e-84b9-67ee37f86d63
Boden, Stuart Andrew
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Bagnall, Darren M.
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Lidzey, David G.
4c1f0189-29db-482f-896b-b90f28909baf
Rodenburg, Cornelia
b3890cb2-387c-40b9-a74a-05b8bcb3eda9
Pearson, Andrew J., Boden, Stuart Andrew, Bagnall, Darren M., Lidzey, David G. and Rodenburg, Cornelia
(2011)
Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy.
Nano Letters, 11 (10), .
(doi:10.1021/nl202269n).
Abstract
We use helium ion microscopy (HeIM) to image the nanostructure of poly(3-hexylthiophene)/[6,6]-phenyl-C61-butric acid methyl ester (P3HT/PCBM) blend thin-films. Specifically, we study a blend thin-film subject to a thermal anneal at 140 °C and use a plasma-etching technique to gain access to the bulk of the blend thin-films. We observe a domain structure within the bulk of the film that is not apparent at the film-surface and tentatively identify a network of slightly elongated PCBM domains having a spatial periodicity of (20 ± 4) nm a length of (12 ± 8) nm
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Published date: 16 September 2011
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 343156
URI: http://eprints.soton.ac.uk/id/eprint/343156
ISSN: 1530-6984
PURE UUID: 0247240c-c143-4e52-b089-6ee1325839ef
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Date deposited: 26 Sep 2012 12:12
Last modified: 15 Mar 2024 03:21
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Contributors
Author:
Andrew J. Pearson
Author:
Stuart Andrew Boden
Author:
Darren M. Bagnall
Author:
David G. Lidzey
Author:
Cornelia Rodenburg
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