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Simulation of electro-thermal aging based on the generic life-expression

Simulation of electro-thermal aging based on the generic life-expression
Simulation of electro-thermal aging based on the generic life-expression
Simulations in polymeric aging models have been performed on the DMM life model in terms of generic aging features. These simulations were carried out on polyethyleneterephthalate (PET) samples with a thickness of 1mm, under DC fields of 40 and 20 MV/m and temperatures of 110 and 180 ºC. Representation of the work was performed in 2-D to demonstrate the evolution of damage structures during aging process in insulating polymers. Susceptible sites in isolated regions will be produced during the aging process. Therefore, failure bonds will be initiated at a high energy concentration sites which leads to create a breakdown path between electrodes. Life-time was taken in the simulations by varying either the susceptibilities of the damage sites parameter or the concentration of the stored energies in the moieties parameter. This paper will provide the inverse relationship between the insulation life and the increasing of the thicknesses. The relation will be based on the Weibull statistical analysis. Simulations based on the generic lifeexpression are used to support this relation and investigate the validity of the model for various thicknesses.
978-1-4673-1018-5
421-424
Alghamdi, Hisham A.
cac9b569-6ff4-4dc5-a7b4-2c7a1a0a399b
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Vaughan, A.S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Alghamdi, Hisham A.
cac9b569-6ff4-4dc5-a7b4-2c7a1a0a399b
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Vaughan, A.S.
6d813b66-17f9-4864-9763-25a6d659d8a3

Alghamdi, Hisham A., Chen, G. and Vaughan, A.S. (2012) Simulation of electro-thermal aging based on the generic life-expression. 2012 IEEE International Conference on Condition Monitoring and Diagnosis, Indonesia. 23 - 27 Sep 2012. pp. 421-424 .

Record type: Conference or Workshop Item (Paper)

Abstract

Simulations in polymeric aging models have been performed on the DMM life model in terms of generic aging features. These simulations were carried out on polyethyleneterephthalate (PET) samples with a thickness of 1mm, under DC fields of 40 and 20 MV/m and temperatures of 110 and 180 ºC. Representation of the work was performed in 2-D to demonstrate the evolution of damage structures during aging process in insulating polymers. Susceptible sites in isolated regions will be produced during the aging process. Therefore, failure bonds will be initiated at a high energy concentration sites which leads to create a breakdown path between electrodes. Life-time was taken in the simulations by varying either the susceptibilities of the damage sites parameter or the concentration of the stored energies in the moieties parameter. This paper will provide the inverse relationship between the insulation life and the increasing of the thicknesses. The relation will be based on the Weibull statistical analysis. Simulations based on the generic lifeexpression are used to support this relation and investigate the validity of the model for various thicknesses.

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e-pub ahead of print date: September 2012
Published date: 23 September 2012
Venue - Dates: 2012 IEEE International Conference on Condition Monitoring and Diagnosis, Indonesia, 2012-09-23 - 2012-09-27
Related URLs:
Organisations: EEE

Identifiers

Local EPrints ID: 343370
URI: https://eprints.soton.ac.uk/id/eprint/343370
ISBN: 978-1-4673-1018-5
PURE UUID: 66095cef-9aa7-4aa8-b031-9cf7e12f6169
ORCID for A.S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

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Date deposited: 09 Oct 2012 15:31
Last modified: 29 Oct 2019 01:57

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