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A study of how varying degrees of functionalised nanofiller have an effect on nanodielectrics

A study of how varying degrees of functionalised nanofiller have an effect on nanodielectrics
A study of how varying degrees of functionalised nanofiller have an effect on nanodielectrics
This paper follows our investigation on the interfacial region within nanodielectrics. Fourier Transform Infrared spectroscopy and Raman spectroscopy were used to analyse the effects of modifying nanofiller with coupling agent. Specifically, silane chemistry was used to treat nanosilica samples; by functionalising nanofiller to different degrees and introducing this into an epoxy matrix, a series of nanocomposite systems were prepared and examined. The dispersion state of the treated nanofiller in epoxy was observed using Scanning electron microscopy, where the optimum distribution was found at a ratio of 4:1 (nanosilica to silane) and the ac breakdown strength is reported to improve with uniformity in dispersion
978-1-4673-1252-3
319-322
Yeung, C.
8bc0d0f2-f047-4906-afdf-cdfa16b44e62
Vaughan, A.S.
6d813b66-17f9-4864-9763-25a6d659d8a3
Yeung, C.
8bc0d0f2-f047-4906-afdf-cdfa16b44e62
Vaughan, A.S.
6d813b66-17f9-4864-9763-25a6d659d8a3

Yeung, C. and Vaughan, A.S. (2012) A study of how varying degrees of functionalised nanofiller have an effect on nanodielectrics. 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Montreal, Canada. 14 - 17 Oct 2012. pp. 319-322 .

Record type: Conference or Workshop Item (Paper)

Abstract

This paper follows our investigation on the interfacial region within nanodielectrics. Fourier Transform Infrared spectroscopy and Raman spectroscopy were used to analyse the effects of modifying nanofiller with coupling agent. Specifically, silane chemistry was used to treat nanosilica samples; by functionalising nanofiller to different degrees and introducing this into an epoxy matrix, a series of nanocomposite systems were prepared and examined. The dispersion state of the treated nanofiller in epoxy was observed using Scanning electron microscopy, where the optimum distribution was found at a ratio of 4:1 (nanosilica to silane) and the ac breakdown strength is reported to improve with uniformity in dispersion

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Published date: 14 October 2012
Venue - Dates: 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Montreal, Canada, 2012-10-14 - 2012-10-17
Organisations: EEE

Identifiers

Local EPrints ID: 344312
URI: http://eprints.soton.ac.uk/id/eprint/344312
ISBN: 978-1-4673-1252-3
PURE UUID: f3d8a458-b049-4b86-98bd-ae818ed4942c
ORCID for A.S. Vaughan: ORCID iD orcid.org/0000-0002-0535-513X

Catalogue record

Date deposited: 18 Oct 2012 07:50
Last modified: 15 Mar 2024 03:05

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Contributors

Author: C. Yeung
Author: A.S. Vaughan ORCID iD

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