The influence of impurity content on thermal stability of low stacking fault energy silver processed by severe plastic deformation
The influence of impurity content on thermal stability of low stacking fault energy silver processed by severe plastic deformation
The effect of the impurity content on the evolution of the ultrafine-grained (UFG) microstructure in low stacking fault energy Ag and its stability at room and elevated temperatures were investigated. Samples of silver having high (99.995%) and somewhat lower (99.99%) purity levels were processed by equal-channel angular pressing (ECAP) at room temperature (RT) up to 16 passes. Although, the minimum grain size achieved by ECAP was ~200 nm for both series, the lattice defect structure was strongly influenced by the impurity content. In the samples processed by 4-16 passes of ECAP a self-annealing occurred during storage RT that was promoted by the higher twin boundary frequency. Both room-and high-temperature thermal stability of 99.99% purity Ag were much better due to the pinning effect of impurities. It was found that a large number of dislocation loops remained in the microstructure even after recrystallization at high temperatures.
222-227
Hegedűs, J.
2167b7f1-de2b-45e5-8014-dd61b9f68de3
Gubicza, J.
4b1812c5-5905-46be-8c26-51c25ef82722
Kawasaki, M.
d0ce18b9-8403-4db2-9cb2-3a6165f288a6
Chinh, N.Q.
75241499-642b-477a-b457-cd08bcab4b9d
Fogarassy, Zs.
a6bd1230-3c19-41a9-9906-b0d261c34518
Langdon, T.G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
2013
Hegedűs, J.
2167b7f1-de2b-45e5-8014-dd61b9f68de3
Gubicza, J.
4b1812c5-5905-46be-8c26-51c25ef82722
Kawasaki, M.
d0ce18b9-8403-4db2-9cb2-3a6165f288a6
Chinh, N.Q.
75241499-642b-477a-b457-cd08bcab4b9d
Fogarassy, Zs.
a6bd1230-3c19-41a9-9906-b0d261c34518
Langdon, T.G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Hegedűs, J., Gubicza, J., Kawasaki, M., Chinh, N.Q., Fogarassy, Zs. and Langdon, T.G.
(2013)
The influence of impurity content on thermal stability of low stacking fault energy silver processed by severe plastic deformation.
Materials Science Forum, 729, .
(doi:10.4028/www.scientific.net/MSF.729.222).
Abstract
The effect of the impurity content on the evolution of the ultrafine-grained (UFG) microstructure in low stacking fault energy Ag and its stability at room and elevated temperatures were investigated. Samples of silver having high (99.995%) and somewhat lower (99.99%) purity levels were processed by equal-channel angular pressing (ECAP) at room temperature (RT) up to 16 passes. Although, the minimum grain size achieved by ECAP was ~200 nm for both series, the lattice defect structure was strongly influenced by the impurity content. In the samples processed by 4-16 passes of ECAP a self-annealing occurred during storage RT that was promoted by the higher twin boundary frequency. Both room-and high-temperature thermal stability of 99.99% purity Ag were much better due to the pinning effect of impurities. It was found that a large number of dislocation loops remained in the microstructure even after recrystallization at high temperatures.
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Published date: 2013
Organisations:
Engineering Mats & Surface Engineerg Gp
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Local EPrints ID: 345721
URI: http://eprints.soton.ac.uk/id/eprint/345721
ISSN: 1662-9752
PURE UUID: b66b0327-d574-49bb-9696-53c3baab2872
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Date deposited: 28 Nov 2012 14:14
Last modified: 15 Mar 2024 03:13
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Author:
J. Hegedűs
Author:
J. Gubicza
Author:
M. Kawasaki
Author:
N.Q. Chinh
Author:
Zs. Fogarassy
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