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The influence of impurity content on thermal stability of low stacking fault energy silver processed by severe plastic deformation

Record type: Article

The effect of the impurity content on the evolution of the ultrafine-grained (UFG) microstructure in low stacking fault energy Ag and its stability at room and elevated temperatures were investigated. Samples of silver having high (99.995%) and somewhat lower (99.99%) purity levels were processed by equal-channel angular pressing (ECAP) at room temperature (RT) up to 16 passes. Although, the minimum grain size achieved by ECAP was ~200 nm for both series, the lattice defect structure was strongly influenced by the impurity content. In the samples processed by 4-16 passes of ECAP a self-annealing occurred during storage RT that was promoted by the higher twin boundary frequency. Both room-and high-temperature thermal stability of 99.99% purity Ag were much better due to the pinning effect of impurities. It was found that a large number of dislocation loops remained in the microstructure even after recrystallization at high temperatures.

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Citation

Hegedűs, J., Gubicza, J., Kawasaki, M., Chinh, N.Q., Fogarassy, Zs. and Langdon, T.G. (2013) The influence of impurity content on thermal stability of low stacking fault energy silver processed by severe plastic deformation Materials Science Forum, 729, pp. 222-227. (doi:10.4028/www.scientific.net/MSF.729.222).

More information

Published date: 2013
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 345721
URI: http://eprints.soton.ac.uk/id/eprint/345721
ISSN: 1662-9752
PURE UUID: b66b0327-d574-49bb-9696-53c3baab2872
ORCID for T.G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

Catalogue record

Date deposited: 28 Nov 2012 14:14
Last modified: 18 Jul 2017 05:08

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Contributors

Author: J. Hegedűs
Author: J. Gubicza
Author: M. Kawasaki
Author: N.Q. Chinh
Author: Zs. Fogarassy
Author: T.G. Langdon ORCID iD

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