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High temperature thermal stability of ultrafine-grained silver processed by equal-channel angular pressing

High temperature thermal stability of ultrafine-grained silver processed by equal-channel angular pressing
High temperature thermal stability of ultrafine-grained silver processed by equal-channel angular pressing
The high temperature thermal stability of the ultrafine-grained (UFG) microstructures in low stacking-fault-energy silver was studied by differential scanning calorimetry (DSC). The UFG microstructures in two samples having purity levels of 99.995 and 99.99 at.% were achieved by four passes of equal-channel angular pressing at room temperature. The defect structure was studied by electron microscopy, X-ray line profile analysis, and positron annihilation spectroscopy before and after the exothermic DSC peak related to recovery and recrystallization. The heat released in the DSC peak was correlated to the change of defect structure during annealing. It was found for both compositions that a considerable fraction of stored energy (~15–20 %) was retained in the samples even after the DSC peak due to the remaining UFG regions and a large density of small dislocation loops in the recrystallized volumes. The larger impurity level in Ag yielded a higher temperature of recrystallization and a lower released heat. The latter observation is explained by the much lower vacancy concentration before the DSC peak which is attributed to the segregation of dopants at grain boundaries resulting in a smaller free volume in the interfaces.
0022-2461
1675-1684
Hegedűs, Z.
22e04e0f-c47c-4494-a5a4-8e0ef60c4ed7
Gubicza, J.
4b1812c5-5905-46be-8c26-51c25ef82722
Kawasaki, M.
d0ce18b9-8403-4db2-9cb2-3a6165f288a6
Chinh, N.Q.
75241499-642b-477a-b457-cd08bcab4b9d
Süvegh, K.
de671b4d-b10b-4ea3-84b8-8a5546bfc732
Fogarassy, Z.
70dc6dad-5130-4627-9394-c35d1beda62e
Langdon, T.G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Hegedűs, Z.
22e04e0f-c47c-4494-a5a4-8e0ef60c4ed7
Gubicza, J.
4b1812c5-5905-46be-8c26-51c25ef82722
Kawasaki, M.
d0ce18b9-8403-4db2-9cb2-3a6165f288a6
Chinh, N.Q.
75241499-642b-477a-b457-cd08bcab4b9d
Süvegh, K.
de671b4d-b10b-4ea3-84b8-8a5546bfc732
Fogarassy, Z.
70dc6dad-5130-4627-9394-c35d1beda62e
Langdon, T.G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86

Hegedűs, Z., Gubicza, J., Kawasaki, M., Chinh, N.Q., Süvegh, K., Fogarassy, Z. and Langdon, T.G. (2013) High temperature thermal stability of ultrafine-grained silver processed by equal-channel angular pressing. Journal of Materials Science, 48 (4), 1675-1684. (doi:10.1007/s10853-012-6926-9).

Record type: Article

Abstract

The high temperature thermal stability of the ultrafine-grained (UFG) microstructures in low stacking-fault-energy silver was studied by differential scanning calorimetry (DSC). The UFG microstructures in two samples having purity levels of 99.995 and 99.99 at.% were achieved by four passes of equal-channel angular pressing at room temperature. The defect structure was studied by electron microscopy, X-ray line profile analysis, and positron annihilation spectroscopy before and after the exothermic DSC peak related to recovery and recrystallization. The heat released in the DSC peak was correlated to the change of defect structure during annealing. It was found for both compositions that a considerable fraction of stored energy (~15–20 %) was retained in the samples even after the DSC peak due to the remaining UFG regions and a large density of small dislocation loops in the recrystallized volumes. The larger impurity level in Ag yielded a higher temperature of recrystallization and a lower released heat. The latter observation is explained by the much lower vacancy concentration before the DSC peak which is attributed to the segregation of dopants at grain boundaries resulting in a smaller free volume in the interfaces.

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More information

Published date: February 2013
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 347072
URI: http://eprints.soton.ac.uk/id/eprint/347072
ISSN: 0022-2461
PURE UUID: e9e6da26-897b-4ff2-911c-22fb3def6468
ORCID for T.G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

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Date deposited: 17 Jan 2013 14:09
Last modified: 15 Mar 2024 03:13

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Contributors

Author: Z. Hegedűs
Author: J. Gubicza
Author: M. Kawasaki
Author: N.Q. Chinh
Author: K. Süvegh
Author: Z. Fogarassy
Author: T.G. Langdon ORCID iD

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