Muttalib, M.F.A, Chen, Ruiqi, Pearce, Stuart and Charlton, Martin (2013) Tapered nanowire waveguide layout for rapid optical loss measurements by cut back technique. SPIE Photonics West 2013, , San Francisco, United States. 02 - 07 Feb 2013. (doi:10.1117/12.2002472).
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Published date: 12 March 2013
Venue - Dates:
SPIE Photonics West 2013, , San Francisco, United States, 2013-02-02 - 2013-02-07
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Keywords:
absorption, fabrication, integrated optics, laser damage threshold, nanofibers, refractive index, scattering, solid state lasers, surface roughness, tantalum
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 350332
URI: http://eprints.soton.ac.uk/id/eprint/350332
PURE UUID: e830e758-0162-42a0-b08a-e535fc880f13
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Date deposited: 25 Mar 2013 17:03
Last modified: 14 Mar 2024 13:23
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Contributors
Author:
M.F.A Muttalib
Author:
Ruiqi Chen
Author:
Stuart Pearce
Author:
Martin Charlton
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