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Tapered nanowire waveguide layout for rapid optical loss measurements by cut back technique

Tapered nanowire waveguide layout for rapid optical loss measurements by cut back technique
Tapered nanowire waveguide layout for rapid optical loss measurements by cut back technique
absorption, fabrication, integrated optics, laser damage threshold, nanofibers, refractive index, scattering, solid state lasers, surface roughness, tantalum
Muttalib, M.F.A
db760721-ce23-4e29-b24a-bd56b0d4e3a0
Chen, Ruiqi
2198083c-19b4-40dd-a28e-5929b80577c5
Pearce, Stuart
1d0ee7c5-8f72-4783-a034-9b2f67de3531
Charlton, Martin
fcf86ab0-8f34-411a-b576-4f684e51e274
Muttalib, M.F.A
db760721-ce23-4e29-b24a-bd56b0d4e3a0
Chen, Ruiqi
2198083c-19b4-40dd-a28e-5929b80577c5
Pearce, Stuart
1d0ee7c5-8f72-4783-a034-9b2f67de3531
Charlton, Martin
fcf86ab0-8f34-411a-b576-4f684e51e274

Muttalib, M.F.A, Chen, Ruiqi, Pearce, Stuart and Charlton, Martin (2013) Tapered nanowire waveguide layout for rapid optical loss measurements by cut back technique. SPIE Photonics West 2013, San Francisco, United States. 02 - 07 Feb 2013. (doi:10.1117/12.2002472).

Record type: Conference or Workshop Item (Paper)

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More information

Published date: 12 March 2013
Venue - Dates: SPIE Photonics West 2013, San Francisco, United States, 2013-02-02 - 2013-02-07
Keywords: absorption, fabrication, integrated optics, laser damage threshold, nanofibers, refractive index, scattering, solid state lasers, surface roughness, tantalum
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 350332
URI: http://eprints.soton.ac.uk/id/eprint/350332
PURE UUID: e830e758-0162-42a0-b08a-e535fc880f13

Catalogue record

Date deposited: 25 Mar 2013 17:03
Last modified: 16 Jul 2019 21:39

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