Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides
Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides
We report an accurate scattering loss 3D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and Finite Difference Time Domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for waveguides with isotropic and anisotropic roughness are calculated for wavelengths ranging from 1550 nm to 3800 nm and compared with reported results in literature. Our simulations show excellent agreement with published experimental results and provide an accurate prediction of roughness-induced loss of 3D arbitrary shaped optical waveguides.
1-10
Jaberansary, Ehsan
579c745a-aef8-484c-9190-93c808552723
Ben Masaud, Taha M.
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Nedeljković, Miloš
b64e21c2-1b95-479d-a35c-3456dff8c796
Milošević, Milan
b28da945-84a5-4317-8896-6d9ea6a69589
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Chong, Harold M.H.
795aa67f-29e5-480f-b1bc-9bd5c0d558e1
June 2013
Jaberansary, Ehsan
579c745a-aef8-484c-9190-93c808552723
Ben Masaud, Taha M.
4b4264c4-210b-4d14-9e2c-3fb8ccbc5b6b
Nedeljković, Miloš
b64e21c2-1b95-479d-a35c-3456dff8c796
Milošević, Milan
b28da945-84a5-4317-8896-6d9ea6a69589
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Chong, Harold M.H.
795aa67f-29e5-480f-b1bc-9bd5c0d558e1
Jaberansary, Ehsan, Ben Masaud, Taha M., Nedeljković, Miloš, Milošević, Milan, Mashanovich, Goran Z. and Chong, Harold M.H.
(2013)
Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides.
IEEE Photonics Journal, 5 (3), , [6601010].
(doi:10.1109/JPHOT.2013.2251869).
Abstract
We report an accurate scattering loss 3D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and Finite Difference Time Domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for waveguides with isotropic and anisotropic roughness are calculated for wavelengths ranging from 1550 nm to 3800 nm and compared with reported results in literature. Our simulations show excellent agreement with published experimental results and provide an accurate prediction of roughness-induced loss of 3D arbitrary shaped optical waveguides.
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e-pub ahead of print date: 8 March 2013
Published date: June 2013
Organisations:
Optoelectronics Research Centre, Nanoelectronics and Nanotechnology, Photonic Systems Circuits & Sensors, NANO
Identifiers
Local EPrints ID: 350795
URI: http://eprints.soton.ac.uk/id/eprint/350795
ISSN: 1943-0655
PURE UUID: 898e142d-a458-4c23-869d-b07932f3257d
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Date deposited: 08 Apr 2013 14:22
Last modified: 15 Mar 2024 03:49
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Contributors
Author:
Ehsan Jaberansary
Author:
Taha M. Ben Masaud
Author:
Milan Milošević
Author:
Harold M.H. Chong
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