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Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides

Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides
Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides
We report an accurate scattering loss 3D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and Finite Difference Time Domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for waveguides with isotropic and anisotropic roughness are calculated for wavelengths ranging from 1550 nm to 3800 nm and compared with reported results in literature. Our simulations show excellent agreement with published experimental results and provide an accurate prediction of roughness-induced loss of 3D arbitrary shaped optical waveguides.
1943-0655
1-10
Jaberansary, Ehsan
579c745a-aef8-484c-9190-93c808552723
Ben Masaud, Taha M.
4b4264c4-210b-4d14-9e2c-3fb8ccbc5b6b
Nedeljković, Milos
b64e21c2-1b95-479d-a35c-3456dff8c796
Milošević, Milan
b28da945-84a5-4317-8896-6d9ea6a69589
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Chong, Harold M.H.
795aa67f-29e5-480f-b1bc-9bd5c0d558e1
Jaberansary, Ehsan
579c745a-aef8-484c-9190-93c808552723
Ben Masaud, Taha M.
4b4264c4-210b-4d14-9e2c-3fb8ccbc5b6b
Nedeljković, Milos
b64e21c2-1b95-479d-a35c-3456dff8c796
Milošević, Milan
b28da945-84a5-4317-8896-6d9ea6a69589
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Chong, Harold M.H.
795aa67f-29e5-480f-b1bc-9bd5c0d558e1

Jaberansary, Ehsan, Ben Masaud, Taha M., Nedeljković, Milos, Milošević, Milan, Mashanovich, Goran Z. and Chong, Harold M.H. (2013) Scattering loss estimation using 2D Fourier analysis and modelling of sidewall roughness on optical waveguides. IEEE Photonics Journal, 5 (3), 1-10. (doi:10.1109/JPHOT.2013.2251869).

Record type: Article

Abstract

We report an accurate scattering loss 3D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and Finite Difference Time Domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for waveguides with isotropic and anisotropic roughness are calculated for wavelengths ranging from 1550 nm to 3800 nm and compared with reported results in literature. Our simulations show excellent agreement with published experimental results and provide an accurate prediction of roughness-induced loss of 3D arbitrary shaped optical waveguides.

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More information

e-pub ahead of print date: 8 March 2013
Published date: June 2013
Organisations: Optoelectronics Research Centre, Nanoelectronics and Nanotechnology, Photonic Systems Circuits & Sensors, NANO

Identifiers

Local EPrints ID: 350795
URI: https://eprints.soton.ac.uk/id/eprint/350795
ISSN: 1943-0655
PURE UUID: 898e142d-a458-4c23-869d-b07932f3257d
ORCID for Milos Nedeljković: ORCID iD orcid.org/0000-0002-9170-7911
ORCID for Harold M.H. Chong: ORCID iD orcid.org/0000-0002-7110-5761

Catalogue record

Date deposited: 08 Apr 2013 14:22
Last modified: 20 Jul 2019 00:51

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