Development of a reusable atomic oxygen sensor using ZnO thick films
Development of a reusable atomic oxygen sensor using ZnO thick films
The paper describes the fabrication and testing of thick film zinc oxide sensors that could be used to monitor the atomic oxygen fluence experienced by spacecraft in low Earth orbit, or that produced in ground-based atomic oxygen sources. Impedance spectroscopy measurements were carried out on the sensors to determine the conduction mechanisms within the thick films when exposed to atomic oxygen. The results indicate that the sensors’ total resistance increases linearly with time when they are exposed to a constant flux of atomic oxygen, and that the sensors can be regenerated by heating.
[7pp.]
Valer, Juan-Carlos
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Roberts, G.T.
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Chambers, A.R.
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Owen, John R.
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12 April 2013
Valer, Juan-Carlos
c3a669fb-eb34-4d5f-9a24-f18481570f75
Roberts, G.T.
deaf59ac-e4ee-4fc2-accf-df0639d39368
Chambers, A.R.
74fa9b7e-6362-478e-a038-15f2828c5446
Owen, John R.
0c3c34da-d8eb-4454-9c12-f77e8bedb243
Valer, Juan-Carlos, Roberts, G.T., Chambers, A.R. and Owen, John R.
(2013)
Development of a reusable atomic oxygen sensor using ZnO thick films.
IEEE Sensors Journal, 99, .
(doi:10.1109/JSEN.2013.2257730).
Abstract
The paper describes the fabrication and testing of thick film zinc oxide sensors that could be used to monitor the atomic oxygen fluence experienced by spacecraft in low Earth orbit, or that produced in ground-based atomic oxygen sources. Impedance spectroscopy measurements were carried out on the sensors to determine the conduction mechanisms within the thick films when exposed to atomic oxygen. The results indicate that the sensors’ total resistance increases linearly with time when they are exposed to a constant flux of atomic oxygen, and that the sensors can be regenerated by heating.
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Valer et al IEEE with pictures.pdf
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Published date: 12 April 2013
Organisations:
Engineering Science Unit
Identifiers
Local EPrints ID: 351481
URI: http://eprints.soton.ac.uk/id/eprint/351481
ISSN: 1530-437X
PURE UUID: fe4fe28d-beb9-4c8a-92dc-1f60bd86c56b
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Date deposited: 24 Apr 2013 11:33
Last modified: 14 Mar 2024 13:39
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Author:
Juan-Carlos Valer
Author:
A.R. Chambers
Author:
John R. Owen
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