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An experimental technique for characterizing slow-wave characteristics of MIS-like transmission lines using aqueous dielectrics

An experimental technique for characterizing slow-wave characteristics of MIS-like transmission lines using aqueous dielectrics
An experimental technique for characterizing slow-wave characteristics of MIS-like transmission lines using aqueous dielectrics
This work is a study of the dielectric propagation properties of laminar substrates, which are known to support low dispersion modes with very small phase velocities. Slow modes are linked to a polarization mode supported by the insulator-semiconductor interface. The mode spectrum of metal-insulator-semiconductor lines is controlled by the substrate resistivity and the ratio of the semiconductor to insulator layer thicknesses. An experimental investigation of substrate modes normally requires the laborious fabrication of many specimens to cover a useful range of parameter variation. In this paper, we present an experimental platform that supports slow-wave propagation and allows easy adjustment of the parameters affecting the interfacial polarization mechanism.
0018-9480
985-993
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf
Papavassiliou, Christos
e51de0f1-db39-4e1f-ac66-8e10a2d282b9
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf
Papavassiliou, Christos
e51de0f1-db39-4e1f-ac66-8e10a2d282b9

Prodromakis, Themistoklis and Papavassiliou, Christos (2010) An experimental technique for characterizing slow-wave characteristics of MIS-like transmission lines using aqueous dielectrics. IEEE Transactions on Microwave Theory and Techniques, 58 (4), 985-993. (doi:10.1109/TMTT.2010.2042521).

Record type: Article

Abstract

This work is a study of the dielectric propagation properties of laminar substrates, which are known to support low dispersion modes with very small phase velocities. Slow modes are linked to a polarization mode supported by the insulator-semiconductor interface. The mode spectrum of metal-insulator-semiconductor lines is controlled by the substrate resistivity and the ratio of the semiconductor to insulator layer thicknesses. An experimental investigation of substrate modes normally requires the laborious fabrication of many specimens to cover a useful range of parameter variation. In this paper, we present an experimental platform that supports slow-wave propagation and allows easy adjustment of the parameters affecting the interfacial polarization mechanism.

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More information

Published date: 1 March 2010
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 351533
URI: https://eprints.soton.ac.uk/id/eprint/351533
ISSN: 0018-9480
PURE UUID: 63315baa-5e17-4c8b-a889-91813e0a2bc7
ORCID for Themistoklis Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

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Date deposited: 23 Apr 2013 14:05
Last modified: 06 Jun 2018 12:24

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Contributors

Author: Christos Papavassiliou

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