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Ionoluminescence in the helium ion microscope

Ionoluminescence in the helium ion microscope
Ionoluminescence in the helium ion microscope
Ionoluminescence (IL) is the emission of light from a material due to excitation by an ion beam. In this work, a helium ion microscope (HIM) has been used in conjunction with a luminescence detection system to characterize IL from materials in an analogous way to how cathodoluminescence (CL) is characterized in a scanning electron microscope (SEM). A survey of the helium ion beam induced IL characteristics, including images and spectra, of a variety of materials known to exhibit CL in an SEM is presented. Direct bandgap semiconductors that luminesce strongly in the SEM, are found not do so in the HIM, possibly due to defect-related non-radiative pathways created by the ion beam. Other materials do, however, exhibit IL, including a cerium-doped garnet sample, quantum dots and rare earth doped LaPO4 nanocrystals. These emissions are a result of transitions between f electron states or transitions across size dependent band gaps. In all these samples, IL is found to decay with exposure to the beam, fitting well to double exponential functions. In an exploration of the potential of this technique for biological tagging applications, imaging with the IL emitted by rare earth doped LaPO4 nanocrystals, simultaneously with secondary electron imaging, is demonstrated at a range of magnifications.
cathodoluminescence, ionoluminescence, helium ion microscopy, scanning electron microscopy, yttrium aluminum garnet (YAG), rare earth, quantum dots
1431-9276
1253-1262
Boden, Stuart A.
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Franklin, Thomas
cb5e1dca-d006-41e0-ab7d-86ddc15c5c78
Scipioni, Larry
05bae635-f591-471c-8b71-bc28fd73f6cb
Bagnall, Darren M.
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Rutt, Harvey N.
e09fa327-0c01-467a-9898-4e7f0cd715fc
Boden, Stuart A.
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Franklin, Thomas
cb5e1dca-d006-41e0-ab7d-86ddc15c5c78
Scipioni, Larry
05bae635-f591-471c-8b71-bc28fd73f6cb
Bagnall, Darren M.
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Rutt, Harvey N.
e09fa327-0c01-467a-9898-4e7f0cd715fc

Boden, Stuart A., Franklin, Thomas, Scipioni, Larry, Bagnall, Darren M. and Rutt, Harvey N. (2012) Ionoluminescence in the helium ion microscope. Microscopy and Microanalysis, 18 (6), 1253-1262. (doi:10.1017/S1431927612013463).

Record type: Article

Abstract

Ionoluminescence (IL) is the emission of light from a material due to excitation by an ion beam. In this work, a helium ion microscope (HIM) has been used in conjunction with a luminescence detection system to characterize IL from materials in an analogous way to how cathodoluminescence (CL) is characterized in a scanning electron microscope (SEM). A survey of the helium ion beam induced IL characteristics, including images and spectra, of a variety of materials known to exhibit CL in an SEM is presented. Direct bandgap semiconductors that luminesce strongly in the SEM, are found not do so in the HIM, possibly due to defect-related non-radiative pathways created by the ion beam. Other materials do, however, exhibit IL, including a cerium-doped garnet sample, quantum dots and rare earth doped LaPO4 nanocrystals. These emissions are a result of transitions between f electron states or transitions across size dependent band gaps. In all these samples, IL is found to decay with exposure to the beam, fitting well to double exponential functions. In an exploration of the potential of this technique for biological tagging applications, imaging with the IL emitted by rare earth doped LaPO4 nanocrystals, simultaneously with secondary electron imaging, is demonstrated at a range of magnifications.

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ILPaper1_v7_Accepted_notTypeSet_comp.pdf - Accepted Manuscript
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More information

Published date: December 2012
Keywords: cathodoluminescence, ionoluminescence, helium ion microscopy, scanning electron microscopy, yttrium aluminum garnet (YAG), rare earth, quantum dots
Organisations: Optoelectronics Research Centre, Nanoelectronics and Nanotechnology, Electronics & Computer Science, Faculty of Physical Sciences and Engineering

Identifiers

Local EPrints ID: 353124
URI: https://eprints.soton.ac.uk/id/eprint/353124
ISSN: 1431-9276
PURE UUID: 25e71864-7b49-413e-9239-cbb83d107e68
ORCID for Stuart A. Boden: ORCID iD orcid.org/0000-0002-4232-1828

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Date deposited: 30 May 2013 12:53
Last modified: 20 Jul 2019 00:57

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Contributors

Author: Stuart A. Boden ORCID iD
Author: Thomas Franklin
Author: Larry Scipioni
Author: Darren M. Bagnall
Author: Harvey N. Rutt

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