Shafik, R.A., Al-Hashimi, B.M., Mathew, J., Pradhan, D.K. and Mohanty, S.P. (2012) RAEF: a power normalized system-level reliability analysis and estimation framework. IEEE Computer Society Annual Symposium on VLSI, Amherst, United States. 18 - 20 Aug 2012.
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Published date: 20 August 2012
Venue - Dates:
IEEE Computer Society Annual Symposium on VLSI, Amherst, United States, 2012-08-18 - 2012-08-20
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Organisations:
Electronic & Software Systems
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Local EPrints ID: 353378
URI: http://eprints.soton.ac.uk/id/eprint/353378
PURE UUID: bb5c993d-858b-4f78-997c-c0bb9c085248
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Date deposited: 11 Jun 2013 13:26
Last modified: 08 Jan 2022 18:00
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Contributors
Author:
R.A. Shafik
Author:
B.M. Al-Hashimi
Author:
J. Mathew
Author:
D.K. Pradhan
Author:
S.P. Mohanty
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