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Energy-efficient fault-tolerant systems

Energy-efficient fault-tolerant systems
Energy-efficient fault-tolerant systems
Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability. Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability; Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches; Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.
978-1-4614-4192-2
Springer
Mathew, Jimson
156eec1e-d690-43eb-a72f-daefd8b04144
Shafik, Rishad A.
aa0bdafc-b022-4cb2-a8ef-4bf8a03ba524
Pradhan, Dhiraj K.
14f13d30-42ec-43bf-941b-3116a7f803fc
Mathew, Jimson
156eec1e-d690-43eb-a72f-daefd8b04144
Shafik, Rishad A.
aa0bdafc-b022-4cb2-a8ef-4bf8a03ba524
Pradhan, Dhiraj K.
14f13d30-42ec-43bf-941b-3116a7f803fc

Mathew, Jimson, Shafik, Rishad A. and Pradhan, Dhiraj K. (eds.) (2014) Energy-efficient fault-tolerant systems , New York, US. Springer, 335pp.

Record type: Book

Abstract

Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability. Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability; Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches; Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.

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More information

Published date: 2014
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 353384
URI: http://eprints.soton.ac.uk/id/eprint/353384
ISBN: 978-1-4614-4192-2
PURE UUID: a194531d-4fee-463f-b60e-30dbbc9770fb

Catalogue record

Date deposited: 10 Jun 2013 13:32
Last modified: 22 Jul 2022 18:33

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Contributors

Editor: Jimson Mathew
Editor: Rishad A. Shafik
Editor: Dhiraj K. Pradhan

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