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Fracture of nanoscale copper films on elastomer substrates

Fracture of nanoscale copper films on elastomer substrates
Fracture of nanoscale copper films on elastomer substrates
This letter describes the evolution of crack spacing in copper films (bonded to elastomer substrates) as a function of applied strain. Tension tests were conducted on cast poly(dimethylsiloxane) substrates coated with sputtered copper films with 200–600 nm thickness. Optical microscopy was used to measure the spacings between parallel cracks (normal to the tension direction) at various levels of applied strain in the range of 0.01%–10%. The measured relationships between applied strain and crack spacing are predicted by micromechanical models of behavior between cracks; the experiments indicate Gc?400–600 J/m2 with an implied defect spacing of ?100–600 ?m. These values are consistent with the theoretical work that is dissipated during necking instabilities during plastic deformation.
copper, cracks, elastomers, fracture, metallic thin films, micromechanics, nanostructured materials, necking, optical microscopy
0003-6951
231914
Begley, Matthew R.
9f4e52bc-507a-4ef6-910f-bd11d25c2209
Scott, Orion N.
63dd01e7-973c-40cd-b439-c4f75b06f05f
Utz, Marcel
c84ed64c-9e89-4051-af39-d401e423891b
Bart-Smith, Hilary
d866c0ea-414c-4516-b9f0-c221b10fb508
Begley, Matthew R.
9f4e52bc-507a-4ef6-910f-bd11d25c2209
Scott, Orion N.
63dd01e7-973c-40cd-b439-c4f75b06f05f
Utz, Marcel
c84ed64c-9e89-4051-af39-d401e423891b
Bart-Smith, Hilary
d866c0ea-414c-4516-b9f0-c221b10fb508

Begley, Matthew R., Scott, Orion N., Utz, Marcel and Bart-Smith, Hilary (2009) Fracture of nanoscale copper films on elastomer substrates. Applied Physics Letters, 95 (23), 231914. (doi:10.1063/1.3268458).

Record type: Article

Abstract

This letter describes the evolution of crack spacing in copper films (bonded to elastomer substrates) as a function of applied strain. Tension tests were conducted on cast poly(dimethylsiloxane) substrates coated with sputtered copper films with 200–600 nm thickness. Optical microscopy was used to measure the spacings between parallel cracks (normal to the tension direction) at various levels of applied strain in the range of 0.01%–10%. The measured relationships between applied strain and crack spacing are predicted by micromechanical models of behavior between cracks; the experiments indicate Gc?400–600 J/m2 with an implied defect spacing of ?100–600 ?m. These values are consistent with the theoretical work that is dissipated during necking instabilities during plastic deformation.

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More information

e-pub ahead of print date: 11 December 2009
Published date: December 2009
Keywords: copper, cracks, elastomers, fracture, metallic thin films, micromechanics, nanostructured materials, necking, optical microscopy
Organisations: Magnetic Resonance

Identifiers

Local EPrints ID: 354812
URI: https://eprints.soton.ac.uk/id/eprint/354812
ISSN: 0003-6951
PURE UUID: 10417d93-af13-4b74-b64c-eb2bcc05b9f7
ORCID for Marcel Utz: ORCID iD orcid.org/0000-0003-2274-9672

Catalogue record

Date deposited: 23 Jul 2013 10:13
Last modified: 20 Jul 2019 00:40

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