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Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe

Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe
Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe
We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe. The recombination velocity was determined from the surface photovoltage and incident photon flux. By scanning of the Kelvin probe tip over the sample, the change in surface recombination velocity can be measured allowing recombination lifetime mapping. Organic monolayers with different chain lengths and exhibiting various recombination lifetimes were synthesized through a two-step chlorination-alkylation technique. The estimated recombination lifetimes were compared against those obtained from an industrial standard technique and were found to be in good agreement.
carrier lifetime, elemental semiconductors, monolayers, organic compounds, passivation, silicon, surface photovoltage, surface recombination
0003-6951
081603-[5pp]
Alderman, Nicholas
0bf3a57d-dc33-491d-b5fd-0922098edabf
Adib Ibrahim, Mohd
32c645c2-c433-4e78-9627-e7dd5ecf9063
Danos, Lefteris
c831e137-37b9-42cc-ab8c-49de31038922
Grossel, Martin C.
403bf3ff-6364-44e9-ab46-52d84c6f0d56
Markvart, Tom
f21e82ec-4e3b-4485-9f27-ffc0102fdf1c
Alderman, Nicholas
0bf3a57d-dc33-491d-b5fd-0922098edabf
Adib Ibrahim, Mohd
32c645c2-c433-4e78-9627-e7dd5ecf9063
Danos, Lefteris
c831e137-37b9-42cc-ab8c-49de31038922
Grossel, Martin C.
403bf3ff-6364-44e9-ab46-52d84c6f0d56
Markvart, Tom
f21e82ec-4e3b-4485-9f27-ffc0102fdf1c

Alderman, Nicholas, Adib Ibrahim, Mohd, Danos, Lefteris, Grossel, Martin C. and Markvart, Tom (2013) Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe. Applied Physics Letters, 103 (8), 081603-[5pp]. (doi:10.1063/1.4818768).

Record type: Article

Abstract

We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe. The recombination velocity was determined from the surface photovoltage and incident photon flux. By scanning of the Kelvin probe tip over the sample, the change in surface recombination velocity can be measured allowing recombination lifetime mapping. Organic monolayers with different chain lengths and exhibiting various recombination lifetimes were synthesized through a two-step chlorination-alkylation technique. The estimated recombination lifetimes were compared against those obtained from an industrial standard technique and were found to be in good agreement.

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Published date: 19 August 2013
Keywords: carrier lifetime, elemental semiconductors, monolayers, organic compounds, passivation, silicon, surface photovoltage, surface recombination
Organisations: Organic Chemistry: Synthesis, Catalysis and Flow, Chemistry, Faculty of Natural and Environmental Sciences

Identifiers

Local EPrints ID: 356428
URI: https://eprints.soton.ac.uk/id/eprint/356428
ISSN: 0003-6951
PURE UUID: 80021369-de27-4a3e-9af7-bb813ed90fb3
ORCID for Martin C. Grossel: ORCID iD orcid.org/0000-0001-7469-6854

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Date deposited: 26 Sep 2013 16:12
Last modified: 20 Jul 2019 01:21

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