Third order Bragg grating filters in small SOI waveguides
Third order Bragg grating filters in small SOI waveguides
Third order grating filters fabricated in small Silicon-on-Insulator rib waveguides are demonstrated. Variations in grating etch depth and duty cycle are considered, and a maximum experimental reflection of 42% is demonstrated for gratings of 1500 µm in length, with a grating period of approximately 689nm and an etch depth of 200nm. Agreement with modeling is shown to be good.
Chan, Seong Phun
2576564e-424a-497c-bd6d-69109b333901
Passaro, Vittorio M.N.
787696b6-5fbe-4ec7-9a7f-b76b132ac819
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Ensell, Graham
dd522300-e6ad-4f1d-8172-b27dd007770f
Reed, Graham T.
ca08dd60-c072-4d7d-b254-75714d570139
2007
Chan, Seong Phun
2576564e-424a-497c-bd6d-69109b333901
Passaro, Vittorio M.N.
787696b6-5fbe-4ec7-9a7f-b76b132ac819
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Ensell, Graham
dd522300-e6ad-4f1d-8172-b27dd007770f
Reed, Graham T.
ca08dd60-c072-4d7d-b254-75714d570139
Chan, Seong Phun, Passaro, Vittorio M.N., Mashanovich, Goran Z., Ensell, Graham and Reed, Graham T.
(2007)
Third order Bragg grating filters in small SOI waveguides.
Journal of the European Optical Society: Rapid Publications, 2, [07029].
Abstract
Third order grating filters fabricated in small Silicon-on-Insulator rib waveguides are demonstrated. Variations in grating etch depth and duty cycle are considered, and a maximum experimental reflection of 42% is demonstrated for gratings of 1500 µm in length, with a grating period of approximately 689nm and an etch depth of 200nm. Agreement with modeling is shown to be good.
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Published date: 2007
Organisations:
Optoelectronics Research Centre, NANO
Identifiers
Local EPrints ID: 356502
URI: http://eprints.soton.ac.uk/id/eprint/356502
ISSN: 1990-2573
PURE UUID: 768c223a-a424-4fab-92f4-c97e40298f6f
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Date deposited: 21 Oct 2013 12:29
Last modified: 29 Oct 2024 02:45
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Contributors
Author:
Seong Phun Chan
Author:
Vittorio M.N. Passaro
Author:
Goran Z. Mashanovich
Author:
Graham Ensell
Author:
Graham T. Reed
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