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Third order Bragg grating filters in small SOI waveguides

Third order Bragg grating filters in small SOI waveguides
Third order Bragg grating filters in small SOI waveguides
Third order grating filters fabricated in small Silicon-on-Insulator rib waveguides are demonstrated. Variations in grating etch depth and duty cycle are considered, and a maximum experimental reflection of 42% is demonstrated for gratings of 1500 µm in length, with a grating period of approximately 689nm and an etch depth of 200nm. Agreement with modeling is shown to be good.
1990-2573
Chan, Seong Phun
2576564e-424a-497c-bd6d-69109b333901
Passaro, Vittorio M.N.
787696b6-5fbe-4ec7-9a7f-b76b132ac819
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Ensell, Graham
dd522300-e6ad-4f1d-8172-b27dd007770f
Reed, Graham T.
ca08dd60-c072-4d7d-b254-75714d570139
Chan, Seong Phun
2576564e-424a-497c-bd6d-69109b333901
Passaro, Vittorio M.N.
787696b6-5fbe-4ec7-9a7f-b76b132ac819
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Ensell, Graham
dd522300-e6ad-4f1d-8172-b27dd007770f
Reed, Graham T.
ca08dd60-c072-4d7d-b254-75714d570139

Chan, Seong Phun, Passaro, Vittorio M.N., Mashanovich, Goran Z., Ensell, Graham and Reed, Graham T. (2007) Third order Bragg grating filters in small SOI waveguides. Journal of the European Optical Society: Rapid Publications, 2, [07029].

Record type: Article

Abstract

Third order grating filters fabricated in small Silicon-on-Insulator rib waveguides are demonstrated. Variations in grating etch depth and duty cycle are considered, and a maximum experimental reflection of 42% is demonstrated for gratings of 1500 µm in length, with a grating period of approximately 689nm and an etch depth of 200nm. Agreement with modeling is shown to be good.

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More information

Published date: 2007
Organisations: Optoelectronics Research Centre, NANO

Identifiers

Local EPrints ID: 356502
URI: http://eprints.soton.ac.uk/id/eprint/356502
ISSN: 1990-2573
PURE UUID: 768c223a-a424-4fab-92f4-c97e40298f6f

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Date deposited: 21 Oct 2013 12:29
Last modified: 14 Mar 2024 14:49

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Contributors

Author: Seong Phun Chan
Author: Vittorio M.N. Passaro
Author: Graham Ensell
Author: Graham T. Reed

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