Using X-ray microbeam diffraction to study the long-range
internal stresses in aluminum processed by ECAP
Using X-ray microbeam diffraction to study the long-range
internal stresses in aluminum processed by ECAP
Aluminum alloy 1050 was processed by equal-channel angular pressing (ECAP) using a single pass (equivalent uniaxial strain of about 0.88). Long-range internal stresses (LRISs) were assessed in the grain/subgrain interiors using X-ray microbeam diffraction to measure the spacing of {5 3 1} planes, with normals oriented approximately +27.3°, +4.9° and ?17.5° off the pressing (axial) direction. The results are consistent with mechanical analysis that suggests the maximum tensile plastic-strain after one pass is expected for +22.5°, roughly zero along the pressing axis, and maximum compressive strain for the ?67.5° direction. The magnitude of the measured maximum compressive long-range internal stress is about 0.13?a (applied stress) in low-dislocation regions within the grain/subgrain interiors. This work is placed in the context of earlier work where convergent beam electron diffraction was used to analyze LRISs in close proximity to the deformation-induced boundaries. The results are complementary and the measured stresses are consistent with a composite model for long-range internal stresses.
x-ray diffraction, composite model, aluminium, equal-channel angular pressing, long-range internal stresses
7741-7748
Lee, I-Fang
9b1c09ae-c623-4096-b66f-2cfa34573296
Phan, Thien
60e40e3d-c0b0-4c93-aa3f-1eb9f25567de
Levine, Lyle E.
1368aa5f-76e8-4750-b4a5-a377147c3956
Tischler, Jonathan Z.
fd4283bf-5074-47f4-96cc-5b1e013dd31b
Geantil, Peter T.
86754819-c949-4dad-8587-4216c7d5bac9
Huang, Yi
9f4df815-51c1-4ee8-ad63-a92bf997103e
Langdon, Terence G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Kassner, Michael E.
44ea4d79-4e98-4160-b3d4-40335133fe9a
October 2013
Lee, I-Fang
9b1c09ae-c623-4096-b66f-2cfa34573296
Phan, Thien
60e40e3d-c0b0-4c93-aa3f-1eb9f25567de
Levine, Lyle E.
1368aa5f-76e8-4750-b4a5-a377147c3956
Tischler, Jonathan Z.
fd4283bf-5074-47f4-96cc-5b1e013dd31b
Geantil, Peter T.
86754819-c949-4dad-8587-4216c7d5bac9
Huang, Yi
9f4df815-51c1-4ee8-ad63-a92bf997103e
Langdon, Terence G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Kassner, Michael E.
44ea4d79-4e98-4160-b3d4-40335133fe9a
Lee, I-Fang, Phan, Thien, Levine, Lyle E., Tischler, Jonathan Z., Geantil, Peter T., Huang, Yi, Langdon, Terence G. and Kassner, Michael E.
(2013)
Using X-ray microbeam diffraction to study the long-range
internal stresses in aluminum processed by ECAP.
Acta Materialia, 61, .
(doi:10.1016/j.actamat.2013.09.013).
Abstract
Aluminum alloy 1050 was processed by equal-channel angular pressing (ECAP) using a single pass (equivalent uniaxial strain of about 0.88). Long-range internal stresses (LRISs) were assessed in the grain/subgrain interiors using X-ray microbeam diffraction to measure the spacing of {5 3 1} planes, with normals oriented approximately +27.3°, +4.9° and ?17.5° off the pressing (axial) direction. The results are consistent with mechanical analysis that suggests the maximum tensile plastic-strain after one pass is expected for +22.5°, roughly zero along the pressing axis, and maximum compressive strain for the ?67.5° direction. The magnitude of the measured maximum compressive long-range internal stress is about 0.13?a (applied stress) in low-dislocation regions within the grain/subgrain interiors. This work is placed in the context of earlier work where convergent beam electron diffraction was used to analyze LRISs in close proximity to the deformation-induced boundaries. The results are complementary and the measured stresses are consistent with a composite model for long-range internal stresses.
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Published date: October 2013
Keywords:
x-ray diffraction, composite model, aluminium, equal-channel angular pressing, long-range internal stresses
Organisations:
Engineering Mats & Surface Engineerg Gp
Identifiers
Local EPrints ID: 357476
URI: http://eprints.soton.ac.uk/id/eprint/357476
ISSN: 1359-6454
PURE UUID: 4e61f182-d983-4a95-b50a-99cf9ae4dc9b
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Date deposited: 08 Oct 2013 09:31
Last modified: 15 Mar 2024 03:39
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Contributors
Author:
I-Fang Lee
Author:
Thien Phan
Author:
Lyle E. Levine
Author:
Jonathan Z. Tischler
Author:
Peter T. Geantil
Author:
Yi Huang
Author:
Michael E. Kassner
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