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Automated controller tuning for atomic force microscopes using estimation based multiple model switched adaptive control

Khan, Umar, Chong, H.M.H. and French, Mark (2013) Automated controller tuning for atomic force microscopes using estimation based multiple model switched adaptive control At 52nd IEEE Conference on Decision and Control, Italy. 10 - 13 Dec 2013.

Record type: Conference or Workshop Item (Paper)
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Published date: 10 December 2013
Venue - Dates: 52nd IEEE Conference on Decision and Control, Italy, 2013-12-10 - 2013-12-13
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Organisations: Electronics & Computer Science

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Local EPrints ID: 359878
URI: http://eprints.soton.ac.uk/id/eprint/359878
PURE UUID: 688ad9aa-dfea-4260-8d4d-77510a0af431

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Date deposited: 15 Nov 2013 14:40
Last modified: 18 Jul 2017 03:17

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Contributors

Author: Umar Khan
Author: H.M.H. Chong
Author: Mark French

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