Badan, Mohammad Imran bin, Bhattacharjee, Subhasish, Shafik, Rishad A., Mathew, Jimson and Pradhan, Dhiraj K. (2013) Lifetime reliability aware checkpointing mechanism: modelling and analysis. IEEE International Symposium on Electronic System Design (ISED), Singapore, Singapore. 12 - 13 Dec 2013.
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Published date: December 2013
Venue - Dates:
IEEE International Symposium on Electronic System Design (ISED), Singapore, Singapore, 2013-12-12 - 2013-12-13
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Organisations:
Electronic & Software Systems
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Local EPrints ID: 359997
URI: http://eprints.soton.ac.uk/id/eprint/359997
PURE UUID: fb88bc62-d411-4911-95f8-1a06cb2b8c52
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Date deposited: 20 Nov 2013 14:38
Last modified: 08 Jan 2022 00:24
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Contributors
Author:
Mohammad Imran bin Badan
Author:
Subhasish Bhattacharjee
Author:
Rishad A. Shafik
Author:
Jimson Mathew
Author:
Dhiraj K. Pradhan
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