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Validation of finite element structural simulation for ohmic microcontact

Validation of finite element structural simulation for ohmic microcontact
Validation of finite element structural simulation for ohmic microcontact
In the current literature, there is no model able to accurately predict the electrical resistance value of rough micro- contacts. Such model requires a coupled thermo-electro-structural analysis that is very difficult to validate in a straightforward manner. In the present approach, atomic force microscopy (AFM) scanned data of contact surface with roughness are used to build finite element (FE) model. As a first step towards multiphysics analysis, the aim of this study is to validate results of structural simulation of a rough gold micro-contact.

A setup with a nanoindenter and a real microswitch is used to extract force-displacement curves. These results are compared to FE simulations which allow evaluating the effects of the main parameters. It is shown that the accuracy of these structural simulations is acceptable for an accurate evaluation of the electrical contact resistance.
419-422
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Pons, Patrick
c6126310-1cb0-471a-a6e0-f0038785051b
Broue, Adrien
84c1f89a-6299-4563-8777-be27d17fe1e9
Martegoutte, Julien
6246ceb3-4492-4a7a-92d1-cf625b0a05f7
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Pons, Patrick
c6126310-1cb0-471a-a6e0-f0038785051b
Broue, Adrien
84c1f89a-6299-4563-8777-be27d17fe1e9
Martegoutte, Julien
6246ceb3-4492-4a7a-92d1-cf625b0a05f7

Liu, Hong, Leray, Dimitri, Pons, Patrick, Broue, Adrien and Martegoutte, Julien (2011) Validation of finite element structural simulation for ohmic microcontact. Procedia Engineering, 25, 419-422. (doi:10.1016/j.proeng.2011.12.104).

Record type: Article

Abstract

In the current literature, there is no model able to accurately predict the electrical resistance value of rough micro- contacts. Such model requires a coupled thermo-electro-structural analysis that is very difficult to validate in a straightforward manner. In the present approach, atomic force microscopy (AFM) scanned data of contact surface with roughness are used to build finite element (FE) model. As a first step towards multiphysics analysis, the aim of this study is to validate results of structural simulation of a rough gold micro-contact.

A setup with a nanoindenter and a real microswitch is used to extract force-displacement curves. These results are compared to FE simulations which allow evaluating the effects of the main parameters. It is shown that the accuracy of these structural simulations is acceptable for an accurate evaluation of the electrical contact resistance.

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More information

Published date: September 2011
Organisations: Engineering Mats & Surface Engineerg Gp, Mechatronics, Faculty of Engineering and the Environment

Identifiers

Local EPrints ID: 360308
URI: http://eprints.soton.ac.uk/id/eprint/360308
PURE UUID: 128ef557-2d4e-47b1-9113-0cf25acb73a1

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Date deposited: 11 Nov 2014 12:41
Last modified: 30 Sep 2019 18:58

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